Abstract
Aspects of the measurement and manufacture of mainly optical components from early times, the present and the future are described. Two instrumental types having the best pedigree and most potential are singled out namely the stylus method and optical methods with, in the latter case, scanning white light interferometry. Critical issues are highlighted and some examples of future requirements and possible developments are given.
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Whitehouse, D. (2013). Metrology Past, Present and Future with Reference to Optics and Manufacture. In: Brinksmeier, E., Riemer, O., Gläbe, R. (eds) Fabrication of Complex Optical Components. Lecture Notes in Production Engineering. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-33001-8_12
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DOI: https://doi.org/10.1007/978-3-642-33001-8_12
Publisher Name: Springer, Berlin, Heidelberg
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