Summary
In non-contact temperature measurement it is possible to calculate the correct object temperature provided the object emissivity, the ambient temperature and the atmosphere temperatures are known.
In many measurement cases on electronic components one should assume that the emissivity varies over the object. It is in special cases even necessary to calculate with varying reflected ambient temperature over the object in order to find the true object temperature.
In this paper different measurement cases are decribed, where these conditions are to be taken into consideration, but also how this is catered for in the software.
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© 1990 Springer-Verlag Berlin Heidelberg
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Wallin, B. (1990). Infrared Microscopy - Contactless Temperature Measurement on Miniaturized Electronic Components. In: Reichl, H. (eds) Micro System Technologies 90. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-45678-7_21
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DOI: https://doi.org/10.1007/978-3-642-45678-7_21
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-45680-0
Online ISBN: 978-3-642-45678-7
eBook Packages: Springer Book Archive