Abstract
An important tool in the exploratory analysis of random patterns are the so called first contact distribution functions. These functions give the distribution of first contact for increasing test sets contained in the void, and provide thereby important information on the “pore” space between particles. An introduction to the use of first contact statistics for exploratory analysis and statistical inference is e.g. given in Stoyan et al. (1987). The statistical aspects of the edge correction techniques presented here are mainly due to Baddeley & Gill (1993), Hansen et al. (1995, 1996) and Chiu & Stoyan (1994).
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References
Baddeley, A. J. & Gill, R. D. (1993). Kaplan-Meier estimators of interpoint distance distributions for spatial point processes. Submitted.
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Chiu, S. N. & Stoyan, D. (1994). Estimators of distance distributions for spatial patterns. Submitted.
Hansen, M. B., Gill, R. D. & Baddeley, A. J. (1995). First contact distributions for spatial patterns: regularity and estimation. Submitted.
Hansen, M. B., Baddeley, A. J. & Gill, R. D. (1996). Kaplan-Meier type estimators for linear contact distributions. Scand. J. Statist, 23.
Stoyan, D., Kendall, W. S. & Mecke, J. (1987). Stochastic Geometry and Its Applications. John Wiley and Sons and Akademie Verlag, Chichester and Berlin.
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© 1996 Physica-Verlag Heidelberg
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Hansen, M.B. (1996). Estimation of First Contact Distribution Functions for Spatial Patterns in S-PLUS. In: Prat, A. (eds) COMPSTAT. Physica-Verlag HD. https://doi.org/10.1007/978-3-642-46992-3_36
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DOI: https://doi.org/10.1007/978-3-642-46992-3_36
Publisher Name: Physica-Verlag HD
Print ISBN: 978-3-7908-0953-4
Online ISBN: 978-3-642-46992-3
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