Abstract
A scanning X-ray microscope was developed at beamline BL-NE1B of the TRISTAN accumulation ring. The microscope uses a Fresnel zone plate as a focusing element. The focused X-ray spot size has been evaluated to be 1 μm. The magnetic domains of a deposited nickel layer have been imaged using circularly polarized radiation produced by a helical undulator. The contrast arises from the effect of magnetic circular dichroism at the Ni L2,3 photoabsorption edges. The photoabsorption spectra from a pair of domains having the opposite magnetization direction to each other have also been measured by probing the single domains with a focused X-ray spot. It was confirmed that the spectra exhibited features corresponding to the relative orientation between the direction of the circular polarization and that of the magnetization of domains. The microscope can offer element- and domain-specific X-ray magnetic spectromicroscopy/microspectroscopy on a sub-micrometer scale.
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Ando, M., Miyahara, T., Kagoshima, Y., Aoki, S., Wang, J. (1998). X-Ray Magnetic Microspectroscopy Using the Circularly Polarized Undulator Radiation at the TRISTAN Accumulation Ring. In: Thieme, J., Schmahl, G., Rudolph, D., Umbach, E. (eds) X-Ray Microscopy and Spectromicroscopy. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-72106-9_27
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DOI: https://doi.org/10.1007/978-3-642-72106-9_27
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