Abstract
Fault injection by heavy-ion radiation from Californium-252 could become a useful method for experimental verification and validation of error handling mechnisms used in computer systems. Heavy ions emitted from Cf-252 have the capacity to cause transient faults and soft errors in integrated circuits. In this paper, results of initial fault injection experiments using the MC6809E 8-bit microprocessor are presented. The purpose of the experiments was to investigate the variation of the error behavior seen on the external buses when the microprocessor chip was irradiated by a Cf-252 source. The variation of the error behavior is imperative for an effective evaluation of error handling mechnisms, e.g. those designed to detect errors caused by a microprocessor. The experiments showed that the errors seen on the external buses of the MC6809E were well spread, both in terms of location and number of bits affected.
This work was supported by the Swedish National Board for Technical Development under contract #86-3585
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© 1989 Springer-Verlag Berlin Heidelberg
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Karlsson, J., Gunneflo, U., Torin, J. (1989). The Effects of Heavy-ion Induced Single Event Upsets in the MC6809E Microprocessor. In: Görke, W., Sörensen, H. (eds) Fehlertolerierende Rechensysteme / Fault-tolerant Computing Systems. Informatik-Fachberichte, vol 214. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-75002-1_24
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DOI: https://doi.org/10.1007/978-3-642-75002-1_24
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