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Totalreflexions- Röntgenfluoreszenzanalyse

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Analytiker-Taschenbuch

Part of the book series: Analytiker-Taschenbuch ((ANALYTIKERTB,volume 10))

Zusammenfassung

Basis der Röntgenfluoreszenzanalyse ist die Anregung von Atomen einer Probe durch primäre Röntgenstrahlung und die dadurch induzierte Emission von sekundärer Röntgenstrahlung, die für die einzelnen Atome bzw. Elemente der Probe charakteristisch ist. Die Röntgenfluoreszenzanalyse arbeitet im allgemeinen verbrauchsfrei und erfaßt dabei oberflächennahe Schichten der Analysenproben. Sie weist fast alle Elemente nach — abgesehen von den leichten — und ist hinsichtlich der analysierbaren Proben universell anzuwenden. Das Verfahren ist nachweisstark, arbeitet sehr schnell und präzise und liefert nach Korrektur von Matrix- effekten auch richtige Ergebnisse. Aufgrund dieser vorteilhaften Eigenschaften hat die Röntgenfluoreszenzanalyse in der Elementanalytik einen bedeutenden Rang erworben.

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  1. Institut für Spektrochemie und angewandte Spektroskopie, Bunsen-Kirchhoff-Straße 11, Dortmund, Deutschland

    R. Klockenkämper

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  1. R. Klockenkämper
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  1. Bismarckstr. 4, D-6940, Weinheim, Deutschland

    Helmut Günzler

  2. Sektion Chemie, Karl-Marx-Universität Leipzig, Talstr. 35, D-7010, Leipzig, Deutschland

    Rolf Borsdorf

  3. Institut Fresenius, Im Maisel, D-6204, Taunusstein, Deutschland

    Wilhelm Fresenius

  4. Weimarerstr. 69, D-6700, Ludwigshafen, Deutschland

    Walter Huber

  5. Rauenthaler Weg 26, D-6000, Frankfurt am Main 71, Deutschland

    Hans Kelker

  6. Analytik/Qualitätskontrolle, Dr. Karl Thomae GmbH, Postfach 1755, D-7950, Biberach, Deutschland

    Ingo Lüderwald

  7. Institut für Spektrochemie, und angewandte Spektroskopie, Bunsen-Kirchhoff-Str. 11, D-4600, Dortmund 1, Deutschland

    Günter Tölg

  8. Robert-Bosch-Krankenhaus, Auerbachstr. 110, D-7000, Stuttgart 50, Deutschland

    Hermann Wisser

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Klockenkämper, R. (1991). Totalreflexions- Röntgenfluoreszenzanalyse. In: Günzler, H., et al. Analytiker-Taschenbuch. Analytiker-Taschenbuch, vol 10. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-76028-0_5

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