Abstract
We perform quantitative estimates of the sensitivity of normal-incidence reflectance to measurement errors and to extrapolation beyond the range covered by measurements, which is needed to compute the Kramers-Kronig integral. A similar analysis is made for the ellipsometric technique, which provides both real and imaginary parts of the response functions at each photon energy. The feasibility of determination of the components of dielectric tensor for highly anisotropic materials is demonstrated. We discuss the midand near-infrared ellipsometric data obtained on oriented films of YBa2Cu3O7 and PrBa2Cu3O7.
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© 1993 Springer-Verlag Berlin, Heidelberg
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Humlíček, J. (1993). Normal-State Infrared Response from Ellipsometric Measurements: YBa2Cu3O7 and PrBa2CU3O7 . In: Kuzmany, H., Mehring, M., Fink, J. (eds) Electronic Properties of High-Tc Superconductors. Springer Series in Solid-State Sciences, vol 113. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-84865-0_40
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DOI: https://doi.org/10.1007/978-3-642-84865-0_40
Publisher Name: Springer, Berlin, Heidelberg
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