Abstract
The nanosecond voltage response of YBaCuo films on Al2O3, MgO and ZrO2 substrates to electromagnetic radiation of millimeter and visible ranges has been investigated. The analysis of experimental conditions for Al2O3 and MgO substrates shows that the resistance change is monitored by the Kapitza boundary shift of temperature during the temporal interval ~ 100 ns limited by the time of phonon return from a substrate into a film. The observed exponential voltage decay is described by the phonon escape time which is proportional to the film thickness and is weakly temperature dependent.
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References
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© 1993 Springer-Verlag Berlin Heidelberg
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Sergeev, A.V., Aksaev, E.E., Gogidze, I.G., Gol’tsman, G.N., Semenov, A.D., Gershenzon, E.M. (1993). Thermal Boundary Resistance at YBaCuO Film-Substrate Interface. In: Meissner, M., Pohl, R.O. (eds) Phonon Scattering in Condensed Matter VII. Springer Series in Solid-State Sciences, vol 112. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-84888-9_157
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DOI: https://doi.org/10.1007/978-3-642-84888-9_157
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