Abstract
Bombardment by electrons results in various phenomena of which the following are most useful for the study of feldspars:
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(1)
emission of X-rays whose wavelength and intensity permit chemical analysis of major and minor elements — see Chapter 13 for technique of electron probe microanalysis which allows chemical analysis of surface areas a few micrometers across
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(2)
emission of light (cathodoluminescence) whose wavelength and intensity permits rapid evaluation of chemical zoning and crystallization conditions involving certain trace elements and physical defects — see Chapter 12
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(3)
diffraction and absorption of electrons: the techniques of transmission electron diffraction and microscopy (TEM) permit measurement of the texture and atomic arrangements right down to domains a few unit-cells across — this is the main topic of the chapter
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(4)
emission of secondary electrons from the surface: the technique of scanning electron microscopy (SEM) allows determination of the topography of the surface. In addition, the technique of photo-emission-electron-microscopy (PEEM) utilizes electrons emitted from a surface irradiated by ultraviolet radiation: focusing of the electrons produces an image of the surface whose intensity depends on the chemical concentration.
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Smith, J.V. (1974). Electron-optical Techniques. In: Feldspar Minerals. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-96173-1_11
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