Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Allen, L. J. (2011). In S. J. Pennycook, & P. Nellist (Eds.), Scanning transmission electron microscopy. New York: Springer.
Boothroyd, C. B. (1998). Journal of Microscopy, 190, 99.
Hall, C. R., & Hirsch, P. B. (1965). Proceedings of the Royal Society of London, A286, 158.
Kohl, H., & Rose, H. (1985). Advance in electronic and electron physics. Amsterdam: Academic Press.
Peng, L. M., et al. (2004). High-energy electron diffraction and microscopy. Oxford: Oxford University Press.
Van Hove, (1954). Physical Review Letters, 95, 249.
Wang, Z. L. (1995). Elastic and inelastic scattering in electron diffraction and imaging. New York: Plenum Press.
Yoshioka, H. (1957). Journal of the Physical Society of Japan, 12, 618.
Zachariazen, W. H. (1967). Theory of X-ray diffraction in crystals. New York: Dover.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2017 Springer Japan KK
About this chapter
Cite this chapter
Tanaka, N. (2017). Debye–Waller Factor and Thermal Diffuse Scattering (TDS). In: Electron Nano-Imaging. Springer, Tokyo. https://doi.org/10.1007/978-4-431-56502-4_30
Download citation
DOI: https://doi.org/10.1007/978-4-431-56502-4_30
Published:
Publisher Name: Springer, Tokyo
Print ISBN: 978-4-431-56500-0
Online ISBN: 978-4-431-56502-4
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)