Abstract
If the various ways of computing the response (output) of a system (circuit) due to any excitation (input) from completely known constitution of the system (given circuit) are categorized as direct, then, by contrast, the various ways in which the constitution (circuit characterization) of a system may be inferred from sets of corresponding excitations and responses fall into the category of inverse methods. [3] To provide the focus on microwave measurements as conventionally understood, we limit the discussion to single-frequency excitation. We then consider how significant features of the system can be inferred through consideration of
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Resonance Condition
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Transformation Invariants
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Physical Symmetry
from data gained when a system is observed in this limited way.
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References
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© 1985 D. Reidel Publishing Company
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Kahn, W.K. (1985). Inverse Methods in Microwave Metrology. In: Boerner, WM., et al. Inverse Methods in Electromagnetic Imaging. NATO ASI Series, vol 143. Springer, Dordrecht. https://doi.org/10.1007/978-94-009-5271-3_22
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DOI: https://doi.org/10.1007/978-94-009-5271-3_22
Publisher Name: Springer, Dordrecht
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