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Low-Energy Electron Diffraction

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Compendium of Surface and Interface Analysis
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Abstract

Low-energy electron diffraction (LEED) [1] is one of the diffraction techniques utilizing low-energy electrons and a powerful method for surface structural analysis.

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References

  1. Pendry, J.B.: Low Energy Electron Diffraction. Academic Press, London and New York (1974)

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  2. Shirasawa, T., Hayashi, K., Mizuno, S., Tanaka, S., Nakatsuji, K., Komori, F., Tochihara, H.: Epitaxial Silicon Oxynitride Layer on a 6H-SiC(0001) Surface. Rhys. Rev. Lett. 98, 136105 (2013)

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  3. Van Hove, M.A., Moritz, W., Over, H., Rous, P.J., Wander, A., Barvieri, A., Materer, N., Starke, U., Somorjai, G.A.: Automated determination of complex surface structures by LEED. Surf. Sci. Rep. 19, 191–229 (1993)

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  4. Pendry, J.B.: Reliability factors for LEED calculations. J. Phys. C 13, 937–944 (1980)

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Correspondence to Yoshimi Horio .

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Horio, Y. (2018). Low-Energy Electron Diffraction. In: The Surface Science Society of Japan (eds) Compendium of Surface and Interface Analysis. Springer, Singapore. https://doi.org/10.1007/978-981-10-6156-1_57

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