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Low-Power Sequential Circuit Design Using Work-Function Engineered FinFETs

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VLSI Design and Test (VDAT 2017)

Part of the book series: Communications in Computer and Information Science ((CCIS,volume 711))

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Abstract

Sequential circuits like pulsed latches and semi-dynamic flip-flops are extensively used in state-of-the-art high performance microprocessors. In this paper, we proposed a novel approach of exploiting the metal gate workfunction to reduce the power consumption and area of the pulsed latches and semi-dynamic flip-flops made using FinFETs. Compared to the design using standard shorted gate FinFETs, the proposed pulsed latch reduces the dynamic and leakage power by  37% and  42% respectively. Similarly, the proposed semi-dynamic flip-flop shows a reduction of  24% and  32% respectively in dynamic and leakage power consumption compared to the standard design. The proposed circuits also show significant improvement in static noise margin and reduction in area.

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Correspondence to Ashish Soni .

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Soni, A., Umap, A., Mohapatra, N.R. (2017). Low-Power Sequential Circuit Design Using Work-Function Engineered FinFETs . In: Kaushik, B., Dasgupta, S., Singh, V. (eds) VLSI Design and Test. VDAT 2017. Communications in Computer and Information Science, vol 711. Springer, Singapore. https://doi.org/10.1007/978-981-10-7470-7_23

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  • DOI: https://doi.org/10.1007/978-981-10-7470-7_23

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  • Publisher Name: Springer, Singapore

  • Print ISBN: 978-981-10-7469-1

  • Online ISBN: 978-981-10-7470-7

  • eBook Packages: Computer ScienceComputer Science (R0)

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