Abstract
Process tomography is a system that can be used to visualize the exact behavior of internal flow in any process. An optical tomography system can safely reconstruct images of the internal flow in non-intrusive and non-invasive sensor. The optical sensor used in the optical tomography system is the most critical part that determines the accuracy and reliability of the system. Therefore, a complementary metal oxide semiconductor (CMOS) area image sensor is used in the developed optical tomography system, in order to produce a high resolution image without disturbing the process flow. This paper describes the development of the driving circuitry system to test the performance of the monochrome CMOS area image sensor.
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Mohd Najib, S., Idroas, M., Ibrahim, M.N. (2014). Driving Circuitry of Complementary Metal Oxide Semiconductor (CMOS) Area Image Sensor for Optical Tomography Instrumentation System. In: Mat Sakim, H., Mustaffa, M. (eds) The 8th International Conference on Robotic, Vision, Signal Processing & Power Applications. Lecture Notes in Electrical Engineering, vol 291. Springer, Singapore. https://doi.org/10.1007/978-981-4585-42-2_24
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DOI: https://doi.org/10.1007/978-981-4585-42-2_24
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