Abstract
This communication presents an Extended Hopfield Neural Network which has been applied to design the extra circuitry for testing a digital circuit during its normal operation, problem which we have shown to be equivalent to the problem of selecting an optimal set of Reed-Muller spectral coefficients. It has been suggested that neural networks, in particular the Hopfield Neural network, may be used to solve linear programming problems. Here, we show how a modification of the Hopfield Network structure also allows to solve non-linear programming problems.
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Ortega, J., Prieto, A., Pelayo, F.J., Lloris, A., Martin-Smith, P. (1991). Optimization problems on concurrent testing solved by neural networks. In: Prieto, A. (eds) Artificial Neural Networks. IWANN 1991. Lecture Notes in Computer Science, vol 540. Springer, Berlin, Heidelberg. https://doi.org/10.1007/BFb0035918
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DOI: https://doi.org/10.1007/BFb0035918
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