Abstract
This chapter introduces key concepts related to Electromagnetic Compatibility (EMC) of Integrated Circuits (ICs), describes basic measurement methods and provides an outline of IC modeling for EMC prediction. A brief description of electric and magnetic field coupling, conducted and radiated mode emissions, as well as susceptibility, are also given in this chapter.
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© 2006 Springer Science+Business Media, Inc.
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Ben Dhia, S., Ramdani, M., Sicard, E. (2006). Basic Concepts in EMC for ICs. In: Ben Dhia, S., Ramdani, M., Sicard, E. (eds) Electromagnetic Compatibility of Integrated Circuits. Springer, Boston, MA. https://doi.org/10.1007/0-387-26601-1_1
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DOI: https://doi.org/10.1007/0-387-26601-1_1
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-387-26600-8
Online ISBN: 978-0-387-26601-5
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