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6. References

  1. N. G. Levenson, C. S. Turner, “An investigation of the Therac-25 accidents”, IEEE Computer, Vol. 26, No. 7, 1993, pp. 18–41

    Google Scholar 

  2. N. G. Leveson, Safeware. System safety and computers. Addison Wesley, ISBN 0-201-11972-2

    Google Scholar 

  3. D. K. Pradhan, Fault-tolerant computer system design, Prentice-hall, ISBN 0-13-057887-8

    Google Scholar 

  4. J. C. Geffroy, G. Motet, Design of Dependable Computing Systems, Kluwer Academic Publishers, ISBN 1-4020-0437-0

    Google Scholar 

  5. A. Avizienis, J.-C. Laprie, B. Randell, C. Lanwehr, “Basic Concepts and Taxonomy of Dependable and Secure Computing”, IEEE Transactions on Dependable and Secure Computing, Vol. 1, No. 1, 2004, pp. 11–33

    Article  Google Scholar 

  6. N. Storey, Safety-Critical Computer Systems, Pearson/Prentice-Hallp, ISBN 0-201-42787-7

    Google Scholar 

  7. M. Abramovici, M. A. Breuer, A. D. Friedman, Digital System Testing and Testable Design, Wiley-IEEE Press, ISBN 0-7803-1062-4

    Google Scholar 

  8. E. Dupont, M. Nicolaidis, P. Rohr, “Embedded robustness IPs for transicnt-error-free ICs”, IEEE Design & Test of Computers, Vol. 19, No. 3, May–June 2002, pp. 54–68

    Article  Google Scholar 

  9. J. Duraes, H. Madeira, “Emulation of Software Faults by Educated Mutation at Machine-level”, IEEE International Symposium on Software Reliability Engineering, 2002, pp. 329–340

    Google Scholar 

  10. P. E. Dodd, L. W. Massengill, “Basic Mechanisms and Modeling of Single-Event Upset in Digital Microelectronics”, IEEE Transactions on Nuclear Science, Vol. 50, No. 3, June 2004, pp. 583–602

    Article  Google Scholar 

  11. J. L. Barth, C. S. Dyer, E. G. Stassinopoulos, “Space, Atmospheric, and Terrestrial Radiation Environments”, IEEE Transactions on Nuclear Science, Vol. 50, No. 3, June 2004, pp. 466–482

    Article  Google Scholar 

  12. A. H. Tabcr, E. Normand, “Investigations and characterization of SEU effects and hardening strategies in avionics”, Defense Nuclear Agency, Alexandria, VA, DNA-TR-94-123, Feb. 1995

    Google Scholar 

  13. A. Holmes-Siedle, L. Adams, Handbook of radiation effects, 2nd edition, Oxford University Press, ISBN 0-19-850733-X

    Google Scholar 

  14. J. Barak, J. Levinson, M. Victoria, W. Hajdas, “Direct process in the enrgy deposition of protons in silicon”, IEEE Transactions on Nuclear Science, Vol. 43, No. 12, Dec. 1996, pp. 2820–2826

    Article  Google Scholar 

  15. S. Duzellier, R. Ecoffet, D. Falguère, T. Nuns, L. Guibcrt, W. Hajdas, M. C. Calvcr, “Low energy proton induced SEE in memories”, Vol. 44, No. 12, Dec. 1997, pp. 2306–2310

    Google Scholar 

  16. T. C. May, M. H. Woods, “Alpha-particle-induced soft errors in dynamic memories”, IEEE Transactions on Electronic Devices, Vol. 26, Feb. 1979, pp. 2–9

    Google Scholar 

  17. E. Takcda, K. Tacheuhi, D. Hisamoto, T. Toyabe, K.Ohshima, K. Itoh, “A cross section of α-particle-induced soft-error phenomena in VLSIs”, IEEE Transactions on Electronic Devices, Vol. 36, Nov. 1989, pp. 2567–2575

    Article  Google Scholar 

  18. R. J. McPartland, “Circuit simulations of alpha-particlc-induccd soft errors in MOS dynamic RAMs”, IEEE J. Solid-State Circuits, Vol. 16, Feb. 1981, pp. 31–34

    Article  Google Scholar 

  19. T. V. Rajeevakumar, N. Lu, W. Henkels, W. Hwang, R. Franch, “A new failure mode of radiation-induced soft errors in dynamic memories”, IEEE Electronic Device Letters, Vol. 9, Dec. 1988, pp. 644–646

    Article  Google Scholar 

  20. L. W. Masscngill, “Cosmic and terrestrial single-event radiation effects in dynamic random access memories”, IEEE Transactions on Nuclear Science, Vol. 43, Apr. 1993, pp. 576–593

    Article  Google Scholar 

  21. K. J. Hass, J. W. Gambles, “Single event transients in deep submicron CMOS”, IEEE 42nd Midwest Symposium on Circuits and Systems, 1999, pp. 122–125

    Google Scholar 

  22. K. Mohanram, N. A. Touba, “Cost-effective approach for reducing soft error failure rate in logic circuits”, IEEE International Test Conference, 2003, pp. 893–901

    Google Scholar 

Download references

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(2006). Background. In: Software-Implemented Hardware Fault Tolerance. Springer, Boston, MA . https://doi.org/10.1007/0-387-32937-4_1

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  • DOI: https://doi.org/10.1007/0-387-32937-4_1

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