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Constructive Nanolithography

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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials

Part of the book series: NATO Science Series II: Mathematics, Physics and Chemistry ((NAII,volume 186))

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Author information

Authors and Affiliations

  1. Weizmann Institute of Science, P.O.B. 26, Rehovot, Israel, 76100

    S.R. Cohen, R. Maoz & J. Sagiv

Authors
  1. S.R. Cohen
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  2. R. Maoz
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  3. J. Sagiv
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Editor information

Editors and Affiliations

  1. University of Aveiro, Portugal

    Paula Maria Vilarinho

  2. Tel Aviv University, Ramat - Aviv, Israel

    Yossi Rosenwaks

  3. NCSU, Raleigh, NC, USA

    Angus Kingon

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© 2005 Kluwer Academic Publishers

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Cohen, S., Maoz, R., Sagiv, J. (2005). Constructive Nanolithography. In: Vilarinho, P.M., Rosenwaks, Y., Kingon, A. (eds) Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials. NATO Science Series II: Mathematics, Physics and Chemistry, vol 186. Springer, Dordrecht. https://doi.org/10.1007/1-4020-3019-3_14

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