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Automated Generation of Positive and Negative Tests for Parsers

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Formal Approaches to Software Testing (FATES 2005)

Part of the book series: Lecture Notes in Computer Science ((LNPSE,volume 3997))

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Abstract

In this paper we describe a specification-based approach to automated generation of both positive and negative test sets for parsers. We propose coverage criteria definitions for such test sets and algorithms for generation of the test sets with respect to proposed coverage criteria. We also present practical results of the technique application to testing syntax analyzers of several languages including C and Java.

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Author information

Authors and Affiliations

  1. Institute for System Programming of Russian Academy of Sciences, Russia

    Sergey Zelenov & Sophia Zelenova

Authors
  1. Sergey Zelenov
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  2. Sophia Zelenova
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Editor information

Editors and Affiliations

  1. Microsoft Research, Redmond, WA, USA

    Wolfgang Grieskamp

  2. Ericsson Deutschland GmbH, 52134, Herzogenrath, Germany

    Carsten Weise

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© 2006 Springer-Verlag Berlin Heidelberg

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Zelenov, S., Zelenova, S. (2006). Automated Generation of Positive and Negative Tests for Parsers. In: Grieskamp, W., Weise, C. (eds) Formal Approaches to Software Testing. FATES 2005. Lecture Notes in Computer Science, vol 3997. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11759744_13

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  • DOI: https://doi.org/10.1007/11759744_13

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-34454-4

  • Online ISBN: 978-3-540-34455-1

  • eBook Packages: Computer ScienceComputer Science (R0)

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