Abstract
Three techniques of transmission electron microscopy (satellite dark field imaging, high resolution imaging and convergent beam diffraction) and their use in the study of charge density wave materials are discussed. Several recent results on 1T-VSe2, 1T-TaS2, TaTe4, NbTe4, (TaSe4)2I and 2H-NbSe2 are presented.
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References
K. Tsutsumi 1982 Phys. Rev. 26, 5756
S. Tanda et al. 1984 J. Phys. Soc. Japan 53, 476
R. L. Withers and J. W. Steeds to be published
D. E. Moncton, J. D. Axe and F. DiSalvo 1977 Phys. Rev. B16, 801
K. K. Fung et al. 1981 J. Phys. C 14, 5417
H. Fujishita, M. Sato and S. Hoshino 1984 Solid State Comm. 49, 313
D. J. Eaglesham et al. 1984 J. Phys. C in press
R. Vincent and J. W. Steeds 1983 J. Appl. Cryst. 16, 317 and refs. therein
M. B. Walker preprint and this conference
R. Vincent, D. M. Bird and J. W. Steeds 1984 Phil. Mag. in press
D. M. Bird, S. McKernan and J. W. Steeds 1984 J. Phys. C in press
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© 1985 Springer-Verlag
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Bird, D.M., Eaglesham, D.J., Withers, R.L., McKernan, S., Steeds, J.W., Wills, H.H. (1985). Transmission electron microscopy for imaging and diffraction studies of low dimensional transition metal chalcogenides. In: Hutiray, G., Sólyom, J. (eds) Charge Density Waves in Solids. Lecture Notes in Physics, vol 217. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-13913-3_181
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DOI: https://doi.org/10.1007/3-540-13913-3_181
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