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Magnetic Force Microscopy: Images of Nanostructures and Contrast Modeling

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Magnetic Microscopy of Nanostructures

Part of the book series: NanoScience and Technology ((NANO))

Abstract

Magnetic force microscopy is a scanning technique, derived from atomic force microscopy, that maps the magnetic interaction between a sample and a magnetic tip. It is simple to use (most microscopes operate in ambient conditions) and provides images with a resolution down to 20 nm in best cases. The images do not, however, correspond directly to the sample magnetization, because of the long range of magnetic forces, their complex sources, as well as the potentially perturbing effect of tip-sample interaction. The emphasis of this chapter is on contrast modeling, especially in nanostructures.

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Authors
  1. A. Thiaville
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  2. J. Miltat
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  3. J.M. GarcĂ­a
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Editor information

Editors and Affiliations

  1. Department of Physics and Astronomy, University of California, Irvine, CA, 92697, USA

    Herbert Hopster

  2. Institut für Angewandte Physik und Zentrum für Mikrostrukturforschung, Universität Hamburg, Jungiusstr. 11, 20355, Hamburg, Germany

    Hans Peter Oepen

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© 2005 Springer-Verlag Berlin Heidelberg

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Thiaville, A., Miltat, J., GarcĂ­a, J. (2005). Magnetic Force Microscopy: Images of Nanostructures and Contrast Modeling. In: Hopster, H., Oepen, H.P. (eds) Magnetic Microscopy of Nanostructures. NanoScience and Technology. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-26641-0_11

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