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Metrological Fringe inpainting

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Fringe 2005

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References

  1. Roddier, C. and Roddier, G. (1987) Interferogram analysis using Fourier transform techniques. Appl. Opt., 26: 1668–1673

    Article  Google Scholar 

  2. Quiroga, J. A., Crespo, D. and Bernabeu, E. (1999) Fourier transform method for automatic processing of moire deflectograms. Opt. Eng. 38: 974–982

    Article  Google Scholar 

  3. Kujawinska, M. and Wojciak, J. (1991) High accuracy Fourier transform fringe pattern analysis. Optics and Lasers in Engineering 14:325–339

    Article  Google Scholar 

  4. Sapiro, G. (2001) Geometric Partial Differential Equations and Image Processing (Cambridge University Press)

    Google Scholar 

  5. Chan, T. F., Shen J. and Vese, L. (2003) Variational PDE models in image processing. Notice of the AMS 50:14–26

    MathSciNet  MATH  Google Scholar 

  6. Guse F. and Kross, J. (1992) A new approach for quantitative interferogram analysis. Proc. SPIE 1781:258–265

    Article  Google Scholar 

  7. Cuevas, F. J., Sossa-Azuela, J. H. and Servin, M. (2002) A parametric method applied to phase recovery from a fringe pattern based on a genetic algorithm. Opt. Comm. 203:213–223

    Article  Google Scholar 

  8. Qian, K. (2004) Windowed Fourier transform for fringe pattern analysis: addendum. Appl. Opt. 43:3472–3473

    Article  Google Scholar 

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© 2006 Springer-Verlag Berlin Heidelberg

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Kemao, Q., Soon, S.H., Asundi, A. (2006). Metrological Fringe inpainting. In: Osten, W. (eds) Fringe 2005. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-29303-5_27

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  • DOI: https://doi.org/10.1007/3-540-29303-5_27

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-26037-0

  • Online ISBN: 978-3-540-29303-3

  • eBook Packages: EngineeringEngineering (R0)

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