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Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy

  • Chapter
Scanning Probe Microscopy

Abstract

This chapter describes the principles, theoretical background, recent developments, and applications of a local probe-based technique for nondestructive high-resolution ferroelectric domain imaging and manipulation—piezoresponse force microscopy (PFM). This technique has proven to be a powerful tool for the characterization of ferroelectric thin films, ceramics, and single crystals. Recent advances in application of PFM for studying a mechanism of polarization reversal at the nanoscale, domain dynamics, degradation effects, and size-dependent phenomena in ferroelectrics are reviewed in detail. Examples of using PFM for the characterization of various polar materials such as ferroelectric films, piezoelectric semiconductors, and ferroelectric relaxors are given.

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Authors and Affiliations

  1. Department of Ceramics and Glass Engineering & Center for Research in Ceramic and Composite, Materials (CICECO), University of Aveiro, 3810-193, Aveiro, Portugal

    Dr. A. L. Kholkin

  2. Materials Sciences and Technology, Division and Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, 1 Bethel Valley Rd, Bldg. 3025, MS6030, Oak Ridge, TN, 37831

    Dr. S. V. Kalinin

  3. Seagate Technology, 1251 Waterfront Place, Pittsburgh, PA, 15222, USA

    Dr. A. Roelofs

  4. Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, 27695, USA

    Prof. A. Gruverman

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  1. Dr. A. L. Kholkin
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  2. Dr. S. V. Kalinin
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  3. Dr. A. Roelofs
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  4. Prof. A. Gruverman
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Editors and Affiliations

  1. Oak Ridge National Laboratory, Oak Ridge, TN, 37831, USA

    Sergei Kalinin

  2. Dept. Materials Science and Engineering, North Carolina State University, Raleigh, NC, 27695, USA

    Alexei Gruverman

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Kholkin, A.L., Kalinin, S.V., Roelofs, A., Gruverman, A. (2007). Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy. In: Kalinin, S., Gruverman, A. (eds) Scanning Probe Microscopy. Springer, New York, NY. https://doi.org/10.1007/978-0-387-28668-6_7

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