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Acoustic Microscopy Applied to NanoStructured Thin Film Systems

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Modern Aspects of Electrochemistry No. 44

Part of the book series: Modern Aspects of Electrochemistry ((MAOE,volume 44))

Abstract

The present volume is devoted to the issues of modeling and numerical simulations in electrochemistry. With the continuing development of more and more powerful computer hardware and software systems, the nature of modeling keeps evolving and expanding. Workers in industry and academia keep developing, testing, and understanding and producing new products. Those in most cases require new materials which benefit from modeling as it obviates the need to actually try every possible new material. Indeed, owing to the growth in the development of material science and technology, the requirements for high-quality, reliable materials have become more stringent. That is so especially in the nano 3D space industries. It is more often than not difficult for conventional materials to completely meet those new more stringent requirements. In this case, closer study of nanostructured materials is often called for. However, such study/search is not possible if no data for securing reliability and safety of the nanostructured materials can be assured.

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References

  1. J. R. Greer, W. C. Oliver, and W. D. Nix, Acta Mater 53 (2005), 1821.

    Article  CAS  Google Scholar 

  2. Y. Isono, T. Namazu, and N. Terayama, J Microelectromech Syst 15(1) (2006), 169.

    Article  Google Scholar 

  3. J.-W. Lee, J.-C. Huang, and J.-G. Duh, Tamkang J Sci Eng 7(4) (2004), 237.

    Google Scholar 

  4. C. Thomsen, H. T. Grahn, H. J. Maris, and J. Tauc., Phys Rev B 34 (1986), 4129.

    Article  CAS  Google Scholar 

  5. H. T. Grahn, H. J. Maris, J. Tauc, and B. Abeles, Phys Rev B 38 (1988), 6066.

    Article  CAS  Google Scholar 

  6. O. B. Wright and K. Kawashima, Phys Rev Lett 69 (1992), 1668.

    Article  CAS  Google Scholar 

  7. H.-N. Lin, H. J. Maris, and L. B. Freund, J Appl Phys 73(1) (1992), 37.

    Article  Google Scholar 

  8. B. Bonello, B. Perrin, and C. Rossignol, J Appl Phys 83(6) (1998), 3081.

    Article  CAS  Google Scholar 

  9. K. Yamanaka, H. Ogiso, and O. Kolosov, Appl Phys Lett 64(2) (1994), 178.

    Article  CAS  Google Scholar 

  10. K. Yamanaka and S. Nakano, Jpn J Appl Phys 35(5) (1996), 3787.

    Article  CAS  Google Scholar 

  11. G. Binnig, C. F. Quate, and Ch. Gerber, Phys Rev Lett 56(1986), 930.

    Article  Google Scholar 

  12. K. Yamanaka, S. Nakano, and H. Ogiso, International Symposium on Measurement Technology and Intelligent Instruments (1996), 451.

    Google Scholar 

  13. S. Amerio, A. V. Goldade, U. Rabe, V. Scherer, B. Bhusan, and W. Arnold, Thin Solid Films 392(2001), 75.

    Article  Google Scholar 

  14. B. Gauitier and V. Bornand, Thin Solid Films 515 (2006), 1592.

    Article  Google Scholar 

  15. A. Atalar, C. F. Quate, and H. K. Wickramasinge, Appl Phys Lett 31 (1977), 791.

    Article  CAS  Google Scholar 

  16. R. D. Weglein, IEEE Trans Sonics SU27(2) (1980), 82.

    Google Scholar 

  17. R. C. Bray, C. F. Quate, J. Calhoun, and R. Kock, Thin Solid Films 74 (1980), 295.

    Article  Google Scholar 

  18. R. D. Weglein, Electron Lett 18(22) (1982), 1003.

    Article  Google Scholar 

  19. C. C. Lee, C. S. Tsai, and X. Cheng, IEEE Trans Sonics Ultrasonics SU-32(2)(1985), 248.

    Google Scholar 

  20. J. Kushibiki and N. Chubachi, Electron Lett 23(12)(1987), 652.

    Article  Google Scholar 

  21. R. C. Addison, M. C. Somekh, J. M. Rowe, and G. A. D. Briggs, SPIE 768 Pattern recognition and acoustical imaging (ed. L. A. Ferrari) (1987), 275.

    Google Scholar 

  22. J. Kushibiki, T. Ishikawa, and N. Chubachi, Appl Phys Lett 57(19) (1990), 1967.

    Article  CAS  Google Scholar 

  23. R. D. Weglein and A. K. Mal, Surf Coat Technol 47 (1991), 667.

    Article  Google Scholar 

  24. A. Okada, C. Miyasaka, and T. Nomura, JIM 33(1) (1992), 73.

    CAS  Google Scholar 

  25. T. Kundu, J Appl Mech 59 (1992), 54.

    Article  CAS  Google Scholar 

  26. Y. Sasaki, T. Endo, T. Yamagishi, and M. Sakai, IEEE Trans UFFC-39(5) (1992), 638.

    Google Scholar 

  27. T. Endo, C. Abe, M. Sakai, and M. Ohono, Proceedings Ultrasonic International 93 Conference (1993), 45.

    Google Scholar 

  28. D. Achenbach, J. D. Kim, and Y. C. Lee, Advances in Acoustic Microscopy, vol. 1, Plenum, New York, (1995), 153.

    Google Scholar 

  29. S. Parthasarathi, B. R. Tittmann, and R. J. Ianno, Thin Solid Films 300 (1997), 42.

    Article  CAS  Google Scholar 

  30. A. Doghmane, Z. Hadjoub, and F. Hadjoub, Thin Solid Films 310 (1997), 203.

    Article  CAS  Google Scholar 

  31. D. Rats, J. von Stebut, and F. Augereau, Thin Solid Films 355–356 (1999), 347.

    Article  Google Scholar 

  32. Z. Guo, J. D. Achenbach, A. Madan, K. Martin, and M. E. Graham, Thin Solid Films 394 (2001), 189.

    Article  CAS  Google Scholar 

  33. M. J. Bamber, K. E. Cooke, A. B. Mann, and B. Derby, Thin Solid Films 398–399 (2001), 299.

    Article  Google Scholar 

  34. F. Zhang, S. Krishnaswarmy, D. Fei, D. A. Rebinsky, and B. Feng, Thin Solid Films 503 (2006), 250.

    Article  CAS  Google Scholar 

  35. B. Hadimioglu and C. F. Quate, Appl Phys Lett 43 (1983), 1006.

    Article  Google Scholar 

  36. K. Karaki and M. Sakai, Ultrasonic Technology 1987, Toyohashi International Conference on Ultrasonic Technology, Toyohashi, Japan, MYU Research, Tokyo (1987), 25.

    Google Scholar 

  37. K. Yamanaka, Y. Nagata, and T. Koda, Ultrasonics Int 89 (1989), 744.

    Google Scholar 

  38. Foster and D. Rugar, Appl Phys Lett 42 (1983), 869.

    Article  Google Scholar 

  39. M. S. Muha, A. A. Moulthrop, G. C. Kozlowski, and B. Hadimioglu, Appl Phys Lett 56 (1990), 1019.

    Article  CAS  Google Scholar 

  40. N. Chubachi, J. Kushibiki, T. Sannomia, and Y. Iyama, Proc IEEE Ultrasonics Symp (1979), 415.

    Google Scholar 

  41. D. A. Davids, P. Y. We, and D. Chizhik, Appl Phys Lett 54(17) (1989), 1639.

    Article  CAS  Google Scholar 

  42. A. Atalar, H. Koymen, and L.Degertekin, Proc IEEE Ultrasonics Symp (1990), 359.

    Google Scholar 

  43. B. T. Khuri-Yakub, C. Cinbis, and P. A. Reinholdtsen, Proc IEEE Ultrasonics Symp (1989), 805.

    Google Scholar 

  44. C. Miyasaka, B. R. Tittmann, and M. Ohno, Res Nondestr Eval 11(1999), 97.

    Google Scholar 

  45. R. D. Weglein, Appl Phys Lett 34 (1979), 179.

    Article  CAS  Google Scholar 

  46. W. Parmon and H. L. Bertoni, Electron Lett 15 (1979), 684.

    Article  Google Scholar 

  47. A. Atalar, J Appl Phys 49 (1978), 5130.

    Article  CAS  Google Scholar 

  48. K. Liang, G. S. Kino, and B. T. Khuri-Yakub, IEEE Trans SU-32 (1985), 213.

    Google Scholar 

  49. T. Endo, Y. Sasaki, T. Yamagishi, and M. Sakai, Jpn Appl Phys 31 (1992), 160.

    Article  CAS  Google Scholar 

  50. J. Kushibiki, K. Horii, and N. Chubachi, Electron Lett 19 (1983), 404.

    Article  CAS  Google Scholar 

  51. J. Kushibiki, T. Kobayashi, H. Ishiji, and N. Chubachi, Appl Phys Lett 61(18) (1992), 2164.

    Article  CAS  Google Scholar 

  52. J. Kushibiki, M. Miyashita, and N. Chubachi, IEEE Photonics Technol Lett 8(11) (1996), 1516.

    Article  Google Scholar 

  53. J. Kushibiki and M. Miyashita, Jpn J Appl Phys 36(7B) (1997), 959.

    Article  Google Scholar 

  54. J. Kushibiki and N. Chubachi, IEEE Trans Sonics Ultrasonics SU-32(2) (1985), 189.

    Google Scholar 

  55. Z. L. Li, IEEE Trans UFCC-40(6) (1993), 680.

    Google Scholar 

  56. J. Kushibiki and M. Arakawa, IEEE Trans UFCC-45(2) (1998), 421.

    Google Scholar 

  57. K. Yamanaka and Y. Enomoto, J Appl Phys 53(1982), 846.

    Article  CAS  Google Scholar 

  58. C. Iett, M. G. Somekh, and G. A. D. Briggs, Proc R Soc Lond A393 (1984), 171.

    Google Scholar 

  59. G. A. D. Briggs, P. J. Jenkins, and M. Hoppe, “How fine a surface crack can you see in a scanning acoustic microscope?,” J Microsc 159 (1990), 15–32.

    Google Scholar 

  60. M. Ohono, C. Miyasaka, and B. R. Tittmann, “Pupli function splitting method in calculating acoustic microscopic signals for elastic discontinuities,” J Wave Motion Sound 33 (2001), 309–320.

    Article  Google Scholar 

  61. C. Miyasaka, B. R. Tittmann, and S. Tanaka, “Characterization of stress at a ceramic/metal joint interface by the V(z) technique of scanning acoustic microscopy,” J Pressure Vessel Technol 124(3) (2002), 336.

    Article  CAS  Google Scholar 

  62. C. Miyasaka, B. R. Tittmann, and S. Tanaka, Nondestr Test Eval 18 (2002), 131.

    Article  Google Scholar 

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Acknowledgements

C.M. thanks M. Schlesinger for his useful advice, and E. Buakulin for developing the simulation software.

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Authors and Affiliations

  1. University of Windsor, Windsor, ON, Canada

    Chiaki Miyasaka

  2. The Pennsylvania State University, University Park, PA, N9B 3P4, 16802, USA

    Chiaki Miyasaka

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  1. Chiaki Miyasaka
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Correspondence to Chiaki Miyasaka .

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Editors and Affiliations

  1. Dept. Physics, University of Windsor, Windsor, N9B 3P4, Canada

    Mordechay Schlesinger

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Miyasaka, C. (2009). Acoustic Microscopy Applied to NanoStructured Thin Film Systems. In: Schlesinger, M. (eds) Modern Aspects of Electrochemistry No. 44. Modern Aspects of Electrochemistry, vol 44. Springer, New York, NY. https://doi.org/10.1007/978-0-387-49586-6_9

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