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References
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Rieder, B., Wenzel, I., Steinhammer, K., Puschner, P. (2007). Using a Runtime Measurement Device with Measurement-Based WCET Analysis. In: Rettberg, A., Zanella, M.C., Dömer, R., Gerstlauer, A., Rammig, F.J. (eds) Embedded System Design: Topics, Techniques and Trends. IFIP – The International Federation for Information Processing, vol 231. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-72258-0_2
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