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Cellular Array-Based Delay-Insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems

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Emerging Nanotechnologies

Part of the book series: Frontiers in Electronic Testing ((FRET,volume 37))

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Complementary metal-oxide semiconductor (CMOS)has been the dominant technology for implementing VLSI systems because it provides a good trade-off high speed and small area.The continuous decrease in transistor feature size has been pushing the CMOS process to its physical limits caused by ultra-thin gate oxides,short channel effects, doping fluctuations, and the unavailability of lithography in nanoscale range. To continue the size/speed improvement trends according to Moore's Law, nanoelectronic and molecular electronic devices are needed. A significant amount of research has been done in nanoscale computing system design [1–5].Although recent research have resulted in the development of basic logic elements and simple circuits in nanoscale,there are still debates on what logic style and architecture will be the best for nanocomputers. A family of asynchronous logic called delay-insensitive circuits has drawn attention in recent years. The advantages of delay-insensitive circuits include flexible timing requirement,low power, high modularity, etc. These characteristics fit the needs of nanoscale computing. Cellular arrays have an ideal architecture for implementing delay-insensitive circuits in nanoscale; they have highly regular structures,simple cell behavior,and flexible scalability [5,6]. The regular structure together with delay-insensitive circuit style makes cellular arrays a viable option for implementing nanocomputing systems.

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References

  1. J. Lee, S. Adachi, F. Peper, and K. Morita, “Embedding Universal DelayInsensitive Circuits in Asynchronous Cellular Spaces,” Fundamenta Informaticae, XX (2003) l-24, IOS Press

    MathSciNet  Google Scholar 

  2. K. Morita, M. Margenstern, and K. Imai, “Universality of Reversible Hexagonal Cellular Automata,” MFCS’98 Satellite Workshop on Frontiers Between Decidability and Undecidability, Aug. 24-25, 1998

    Google Scholar 

  3. S. Adachi, F. Peper, and J. Lee, “Computation by Asynchronously Updating Cellular Automata,” Journal of Statistical Physics, Vol. 114, Nos. 1-2, Jan. 2004

    Google Scholar 

  4. J. Lee, F. Peper, S. Adachi, K. Morita, and S. Mashiko, “Reversible Computation in Asynchronous Cellular Automata,” Unconventional Models of Computation (2002), LNCS 2509, pp. 220-229

    Google Scholar 

  5. F. Peper, J. Lee, S. Adachi, and S. Mashiko, “Laying out circuits on asynchronous cellular arrays: a step towards feasible nanocomputers?” Nanotechnology, Vol. 14, 469-485, 2003

    Article  Google Scholar 

  6. F. Peper, J. Lee, F. Abo, T. Isokawa, S. Adachi, N. Matsui, and S. Mashiko, “Fault-tolerance in nanocomputers: a cellular array approach,” IEEE Transactions on Nanotechnology, Vol. 3, No. 1, 187-201, Mar. 2004

    Article  Google Scholar 

  7. P. K. Lala, Self-checking and Fault-tolerant Digital Design, Morgan Kaufmann, San Francisco, 2001

    Google Scholar 

  8. A. J. Heinrich, C. P. Lutz, J. A. Gupta, and D. M. Eigler, “Molecule cascades,” Science, Vol. 298, 1381-1387, Nov. 2002

    Article  Google Scholar 

  9. M. Renaudin and B. El Hassan, “The design of fast asynchronous adder structures and their implementation using DCVS logic,” 1994 IEEE International Symposium on circuits and systems, Vol. 4, 291-294, 1994

    Google Scholar 

  10. W. Kuang, “Iterative Ring and Power-Aware Design Techniques for Self-Timed Digital Circuits,” Ph.D. dissertation, University of Central Florida, July 2003

    Google Scholar 

  11. J. Di, J. S. Yuan, and M. Hagedorn, “Energy-aware Multiplier Design in Multirail Encoding Logic,” IEEE 45th Midwest Symposium on Circuits and Systems, Aug. 2002

    Google Scholar 

  12. P. Patra and D. S. Fussell, “Building-blocks for designing DI circuits,” Technical report TR93-23, Dept. of Computer Sciences, The University of Texas at Austin, Nov. 1993

    Google Scholar 

  13. P. K. Lala, Digital Circuit Testing and Testability, Academic Press, New York, 1997

    Google Scholar 

  14. J. Di, P. K. Lala, and D. Vasudevan, “On the Effect of Stuck-at Faults on DelayInsensitive Nanoscale Circuits,” Defect and Fault Tolerance in VLSI Systems Symposium 2005 (DFT 2005), Oct. 2005

    Google Scholar 

  15. G. Snider, P. Kuekes, and R. S. Williams, “CMOS-like logic in defective, nanoscale crossbars,” Nanotechnology, Vol. 15, 881-891, 2004

    Article  Google Scholar 

  16. A. Dehon, “Array-based architecture for FET-based nanoscale electronics,” IEEE Transactions on Nanotechnology, Vol. 2, No. 1, 23-32, Mar. 2003

    Article  MathSciNet  Google Scholar 

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Di, J., Lala, P.K. (2008). Cellular Array-Based Delay-Insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems. In: Tehranipoor, M. (eds) Emerging Nanotechnologies. Frontiers in Electronic Testing, vol 37. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-74747-7_7

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  • DOI: https://doi.org/10.1007/978-0-387-74747-7_7

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