Abstract
The problem of analyzing the effects of transient faults in a digital system is very complex, and it may be addressed successfully only if it is performed at different steps of the design process. In this work we report and overview of fault injection, discussing which techniques are available that can be used starting from the early conception of the system and arriving to the transistor level.
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Anghel, L., Rebaudengo, M., Reorda, M.S., Violante, M. (2007). Multi-level Fault Effects Evaluation. In: VELAZCO, R., FOUILLAT, P., REIS, R. (eds) Radiation Effects on Embedded Systems. Springer, Dordrecht. https://doi.org/10.1007/978-1-4020-5646-8_4
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DOI: https://doi.org/10.1007/978-1-4020-5646-8_4
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