Abstract
Crystallographic studies of Bismuth (Bi) layer structured ferroelectric (BLSF) materials were first carried out by Aurivillius [1–3] and their ferroelectric or piezoelectric properties have been revealed by a large number of researchers [4–106, 108, 110–117]. The piezoelectric properties of Na0.5Bi4.5Ti4O15 (NBT) [17, 23, 25, 26], BaBi4Ti4O15 [41], SrBi4Ti4O15 (SBTi) [17, 40, 54], and CaBi4Ti4O15 (CBT) [39, 53, 63] ceramic materials have been reported in terms of resonator application. Their applicability to practical application seemed to be quite high because the electromechanical coupling factors for thickness extensional mode vibrations were between 15 and 20%, and the typical values for the mechanical quality factor (Q m) were higher than 2,000 [39], and these properties are favorable for the oscillator applications. However, their temperature coefficient of resonance frequency (TCF) is not sufficiently low for the oscillator applications which require a stable resonance frequency with fine tolerance against various condition changes such as temperature changes.
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Ando, A., Kimura, M. (2012). Resonator Characteristics of Bismuth Layer Structured Ferroelectric Materials. In: Priya, S., Nahm, S. (eds) Lead-Free Piezoelectrics. Springer, New York, NY. https://doi.org/10.1007/978-1-4419-9598-8_13
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