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Surface texture: two-dimensional

  • Chapter
Industrial Metrology

Abstract

The concept of surface technology has previously varied according to whether a scientist, technologist, or engineer has inspected a surface. An individual’s viewpoint differs depending upon their specific interest and technical emphasis. Therefore, a surface cannot be thought of in isolation from other features, because each is valid and necessary and needs to be considered to gain an overall impression of its industrial, or scientific usage.

“Errors, like straws, upon the surface flow; He who would search for pearls must dive below.”

(All for Love, Prologue, 25; John Dryden 1631–1700)

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References

Journal and conference papers

  • Bell, T. Surface engineering: past, present and future. Surface Engineering 6(1), 1990, 31–40.

    Google Scholar 

  • Bjuggren, M., Krummenacher, L. and Mattsson, L. Noncontact surface roughness measurement of engineering surfaces by total integrated infrared scattering. Precision Engineering 20(1), 1997, 33–45.

    Article  Google Scholar 

  • Bousefield, B. and Bousefield, T. Progress towards a metallography standard. Metals and Materials March 1990, 146–148.

    Google Scholar 

  • Brown A.J.C. and Gilbert, F. Industrial applications for optical profilometry. Sensor Review January 1990, 35–37.

    Article  Google Scholar 

  • Caber, P.J. An interferometric profiler for rough surfaces. Applied Optics 32, 1993, 3438–3441.

    Article  Google Scholar 

  • Downs M.J., Mason, N.M. and Nelson, J.C.C. Measurement of the profiles of super-smooth surfaces using optical interferometry. Proceedings of SPIE-1009, 1989, 14–17.

    Google Scholar 

  • Drews, W.E. Surface measurement: an advanced technology. Quality Progress April 1987, 43–46.

    Google Scholar 

  • Dyson, J. Interferometry as a Measuring Tool. Machinery Pub. Co., 1970.

    Google Scholar 

  • Garratt, J. and Bottomly, S.C. Technology transfer in the development of a nanotopographic instrument. Nanotechnology 1, 1990, 38–43.

    Article  Google Scholar 

  • Garratt J. and Mills, M. Measurement of the roughness of super-smooth surfaces using a stylus instrument. Nanotechnology 7, 1996, 13–20.

    Article  Google Scholar 

  • Gee, M.G. and McCormick, N.J. The application of confocal scanning microscopy to the examination of ceramic wear surfaces. Journal of Physics D: Applied Physics 25, 1990, 230–235.

    Article  Google Scholar 

  • Harvie, A. and Beattie, J.S. Surface texture measurement. Production Engineer, 1978, 25–29.

    Google Scholar 

  • Hongai, Z., Zhixiang, C. and Riyao, C. The control of roughness with expert system controller. Proceedings of the First International Mach. Mon. and Diagnostics, Las Vegas, 1989, 813–817.

    Google Scholar 

  • Kuwamura, S. and Yamaguchi, I. Wavelength scanning profilome-try for real-time surface shape measurement. Applied Optics 36, 1997, 4473–4482.

    Article  Google Scholar 

  • Leach, R.K. Measurement of a correction for the phase change on reflection due to surface roughness. Proceedings of SPIE3477, 1998, 138–151.

    Article  Google Scholar 

  • Leach, R.K. Traceable measurement of surface texture at the national physical laboratory using Nanosurf IV. Measurement Science and Technology 11, 2000, 1162–1172.

    Article  Google Scholar 

  • Leach, R.K. Traceable measurement of surface texture in the optics industry. Large Lenses and Prisms Conference, University College London, 27–30 March 2001.

    Google Scholar 

  • Leach, R.K. and Hart, A.. Investigation into the shape of diamond styli used for surface texture measurement. NPL Report CBTLM10, April 2001, 1–12.

    Google Scholar 

  • Mansfield, D. Surface characterisation via optical diffraction. SPIE (International Society for Optical Engineering) Vol. 1573: Commercial Applications of Precision Manufacture at the Sub-Micron Level, 1991, 163–169.

    Google Scholar 

  • Prostrednik, D. and Osanna, P.H. The Abbott curve: well known in metrology but not on technical drawings. International Journal of Machine Tools Manufacture 38(5–6), 1998, 741–745.

    Article  Google Scholar 

  • Schaffer, G.H. The many faces of surface texture. American Machinist, June 1988, 61–68.

    Google Scholar 

  • Schneider, U., Steckroth, A. and Hubner, G. An approach to the evaluation of surface profiles by separating them into functionally different parts. Surface Topography 1, 1988, 71–83.

    Google Scholar 

  • Stout, K. How smooth is smooth? Surface measurements and their relevance in manufacturing. Production Engineer May 1980, 17–22.

    Article  Google Scholar 

  • Thomas, T.R. Trends in surface roughness. International Journal of Machine Tools Manufacture 38(5–6), 1998, 405–411.

    Article  Google Scholar 

  • Trumpold, H. and Heldt, E. Why filtering surface profiles. International journal of Machine Tools Manufacture 38 (5–6), 1998, 639–646.

    Article  Google Scholar 

  • Ulbricht, R. Die Bestimmung der mittleren räumlichen Lichtintensität durch nur eine. Messung Electrotechnische Zeitschrift 29, 1900, 595–601.

    Google Scholar 

  • Vorburger, T.V. and Teague, E.C. Optical techniques for online measurement of surface topography. Precision Engineering 3, 1981, 63–83.

    Article  Google Scholar 

  • Westburg, J. Opportunities and problems when standardising and implementing surface structure parameters in industry. International Journal of Machine Tools and Manufacture 38(5–6), 1998, 413–416.

    Article  Google Scholar 

  • Whitehouse, D.J. Some ultimate limits on the measurement of surfaces using stylus techniques. Measurement and Control 8, 1975, 147–151.

    Google Scholar 

  • Whitehouse, D.J. Beta functions for surface topology? Annals of the CIRP 27, 1978, 491–497.

    Google Scholar 

  • Whitehouse, D.J. Surfaces: a link between manufacture and function. Proceedings of IMechE 192, 1978, 179–187.

    Article  Google Scholar 

  • Whitehouse, D.J. Conditioning of the manufacturing process using surface finish. Proceedings of the Third Lamdamap Conference, Computational Mechanics July 1997, 3–20.

    Google Scholar 

  • Whitehouse, D.J. Some theoretical aspects of surface peak parameters. Precision Engineering 23, 1999, 94–102.

    Article  Google Scholar 

  • Whitehouse, D.J. Surface measurement fidelity. Proceedings of the Fourth Lamdamap Conference, University of Northumbria, WIT Press, July 1999, 267–276.

    Google Scholar 

  • Whitehouse, D.J. Characterizing the machined surface condition by appropriate parameters. Proceedings of the Third Industrial Tooling Conference, Southampton Institute, Molyneux Press, September 1999, 8–31.

    Google Scholar 

  • Wyant, J.C. Computerized interferometric measurement of surface microstructure. Proceedings of SPIE-2576, 1995, 122–130.

    Article  Google Scholar 

  • Zahwi, S. and Mekawi, A.M. Some effects of stylus force on scratching surfaces. Eighth International Conference on Metrology and Properties of Engineering Surfaces, University of Huddersfield, 26–28 April 2000.

    Google Scholar 

Books, booklets and guides

  • Bennett, J.M. and Mattsson, L. Introduction to Surface Roughness and Scattering. Washington, DC: Optical Society of America, 1989.

    Google Scholar 

  • Busch, T. and Wilkie Brothers Foundation. Fundamentals of Dimensional Metrology. Delmar, 1989.

    Google Scholar 

  • Dagnall, M.A. Exploring Surface Texture. Taylor Hobson Precision, 1997.

    Google Scholar 

  • Dyson, J. Interferometry as a Measuring Tool. Machinery Pub. Co., 1970.

    Google Scholar 

  • Gayler, J.F.W, and Shotbolt, C.R. Metrology for Engineers. Cassell, 1990.

    Google Scholar 

  • Haycocks, J.A. Novel Probes for Surface Texture Metrology. NPL Report MOM105, July 1991.

    Google Scholar 

  • Hume, K.J. Engineering Metrology. Macdonald, 1970.

    Google Scholar 

  • Hume, K.J. A History of Engineering Metrology. Mechanical Engineering Pub., 1980.

    Google Scholar 

  • Leach, R.K. NPL Good Practice Guide No. 37, Measurement of Surface Texture using Stylus Instruments. NPL, 2001

    Google Scholar 

  • Leach, R.K. and Hart, A. Investigation into the Shape of Diamond Styli used for Surface Texture Assessment. NPL Report CBTLM 10, April 2001.

    Google Scholar 

  • Mainsah, E., Greenwood, J.A. and Chetwynd, D.G. Metrology and Properties of Engineering Surfaces. Kluwer Academic Pub., 2001.

    Book  Google Scholar 

  • Mummery, L. Surface Texture Analysis: The Handbook. Hommelwerke GmbH, 1990.

    Google Scholar 

  • Nicolls, M.O. The Measurement of Surface Finish. DeBeers Technical Service Centre, DeBeers Industrial Diamond Division, Charters, UK, 1980.

    Google Scholar 

  • Reason, R.E. The Measurement of Surface Texture. Cleaver-Hume Press, 1960.

    Google Scholar 

  • Sander, M. A Practical Guide to the Assessment of Surface Texture. Feinpruf GmbH, 1991.

    Google Scholar 

  • Stover, J.C. Optical Scattering. McGraw-Hill, 1990.

    Google Scholar 

  • Thomas, G.G. Engineering Metrology. Butterworths, 1974.

    Google Scholar 

  • Thomas, T.R. Rough Surfaces. Imperial College Press, 1999.

    Google Scholar 

  • Whitehouse, D.J. and Reason, R.E. The Equation of the Mean Line of Surface Texture Found by an Electric Wave Filter. Rank Taylor Hobson Pub., 1965.

    Google Scholar 

  • Whitehouse, D.J. Handbook of Surface Metrology. Institute of Physics, Bristol and Philadelphia, 1994.

    Google Scholar 

  • Whitehouse, D.J. Surfaces and their Measurement. Hermes Penton Science, 1991.

    Google Scholar 

  • Williams, D.C. Optical Methods in Engineering Metrology. Chapman & Hall, 1993.

    Book  Google Scholar 

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Author information

Authors and Affiliations

  1. Faculty of Technology, Southampton Institute, East Park Terrace, Southampton, SO14 0RD, UK

    Graham T. Smith MPhil (Brunel), PhD (Birmingham), CEng, FIMechE, FIEE

Authors
  1. Graham T. Smith MPhil (Brunel), PhD (Birmingham), CEng, FIMechE, FIEE
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© 2002 Springer-Verlag London

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Smith, G.T. (2002). Surface texture: two-dimensional. In: Industrial Metrology. Springer, London. https://doi.org/10.1007/978-1-4471-3814-3_1

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  • DOI: https://doi.org/10.1007/978-1-4471-3814-3_1

  • Publisher Name: Springer, London

  • Print ISBN: 978-1-84996-878-2

  • Online ISBN: 978-1-4471-3814-3

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