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On Semiparametric Estimation of Reliability From Accelerated Life Data

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Statistical and Probabilistic Models in Reliability

Part of the book series: Statistics for Industry and Technology ((SIT))

Abstract

Additive accumulation of damages model and its generalizations are considered. Semiparametric estimation procedure of the survival function under the normal stress from accelerated life testing data is proposed. Experiments with step-stresses with random switch up moments are considered. Asymptotic properties of estimation are investigated.

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© 1999 Springer Science+Business Media New York

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Bagdonavičius, V., Nikulin, M.S. (1999). On Semiparametric Estimation of Reliability From Accelerated Life Data. In: Ionescu, D.C., Limnios, N. (eds) Statistical and Probabilistic Models in Reliability. Statistics for Industry and Technology. Birkhäuser, Boston, MA. https://doi.org/10.1007/978-1-4612-1782-4_5

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  • DOI: https://doi.org/10.1007/978-1-4612-1782-4_5

  • Publisher Name: Birkhäuser, Boston, MA

  • Print ISBN: 978-1-4612-7280-9

  • Online ISBN: 978-1-4612-1782-4

  • eBook Packages: Springer Book Archive

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