Abstract
The importance of visual inspection of ICs, usually carried out by skilled human operators, stems from the fact that most electrical or mechanical device defects can be revealed by optical features visible in, for example, a microscope.
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© 1990 Plenum Press, New York
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Pau, L.F. (1990). Inspection of Integrated Circuits and Gate Arrays. In: Computer Vision for Electronics Manufacturing. Advances in Computer Vision and Machine Intelligence. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0507-1_5
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DOI: https://doi.org/10.1007/978-1-4613-0507-1_5
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4612-7841-2
Online ISBN: 978-1-4613-0507-1
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