Abstract
The purpose of this laboratory is to prepare samples of metallic, ceramic, polymeric, and biological specimens for examination and analysis in the SEM. The organization is such that under each type of material sample preparations are discussed for surface topography (e.g., fracture surface), microstructural analysis (e.g., phase morphology), and x-ray microanalysis. Special procedures for semiconductor devices, polymers, and biological samples are also considered. The objective is to provide a brief outline and enough general references to enable the reader to produce all of the specimens used in this workbook. The outlined methods should not be considered comprehensive, however, and the reader is strongly urged to consult the references listed. For further discussion, see SEMXM, Chapters 9–12.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
G. F. vanderVoort, Metallography: Principles and Practice, McGraw-Hill, New York (1984).
L. E. Samuels, Metallographic Polishing by Mechanical Methods, Third Edition, American Society for Metals, Metals Park, Ohio (1982).
J. L. McCall and W. M. Mueller, Metallographic Specimen Preparation: Optical and Electron Microscopy, Plenum Press, New York (1974).
W. Tegart, Electrolytic and Chemical Polishing of Metals in Research and Industry, Second Edition, Pergammon, New York (1959).
ASM Metals Handbook, Metallography and Microstructures, 5, ASM International, Metals Park, Ohio (1985).
ASTM, Methods of Metallographic Specimen Preparation, ASTM, STP 284, American Society for Testing Materials, Philadelphia, Pennsylvania. (1960).
D. B. Holt and D. C. Joy, eds., SEM Microcharacterization of Semiconductors, Academic Press, New York (1989).
Petrographic Sample Preparation, AB Met. Dig. 12/13(1), Buehler Ltd., Evanston, Illinois (1973).
D. G. W. Smith, ed., Microbeam Techniques, A Short Course Handbook, 1, Minearological Association of Canada (1976).
D. E. Caldwell and P. W. Weiblem, Economic Geology, 60 (1965) 1320.
C. M. Taylor and A. S. Radtke, Economic Geology, 60 (1965) 1306.
L. C. Sawyer and D. T. Grubb, Polymer Microscopy, Chapman and Hall, New York (1987).
A. S. Holik et al, Grinding and polishing techniques for thin sectioning of polymeric materials for transmission light microscopy, Microstructural Science, 7 (1979) 357–367.
U. Linke and W. U. Kopp, Preparation of polished specimens and thin sections of plastics, Praktische Metallographie, 17 (1980) 479–488.
D. G. Robinson et al., Methods of Preparation for EM, Springer-Verlag, Berlin (1987).
M. A. Hayat, Fixation for Electron Microscopy, Academic Press, New York (1982).
M. A. Hayat, Basic Techniques for Transmission Microscopy, Academic Press, New York (1986).
A. M. Glauert, ed., Practical Methods in Electron Microscopy, 3 and 5, Elsevier-North Holland (1975–1977).
P. B. DeNee, Scanning Electron Microscopy/1978, O. Johari ed., SEM, Inc., AMF O’Hare, Illinois (1978) 479.
D. A. Walker, Scanning Electron Microscopy, O. Johari ed., SEM, Inc., AMF O’Hare, Illinois (1978) 185.
P. J. Goodhew in “Specimen Preparation for Transmission Electron Microscopy of Materials”, Materials Research Society Symposium Series Vol. 115, J. G. Bravman, R. M. Anderson, and M. L. McDonald eds. (1988) 51.
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 1990 Plenum Press, New York
About this chapter
Cite this chapter
Lyman, C.E. et al. (1990). Bulk Specimens for SEM and X-Ray Microanalysis. In: Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0635-1_28
Download citation
DOI: https://doi.org/10.1007/978-1-4613-0635-1_28
Publisher Name: Springer, Boston, MA
Print ISBN: 978-0-306-43591-1
Online ISBN: 978-1-4613-0635-1
eBook Packages: Springer Book Archive