Abstract
The intent statistical analysis or simulation is to obtain a statistical measure of circuit performance as a function of processing and fabrication variations. The Monte Carlo method of obtaining a statistical measure of performance involves repeated analyses where for each analysis element and parameter values are selected from their respective distributions. Typically a sample size of 100 or more simulations is required. This chapter will concentrate primarily on the development of a language and terminology for statistically describing circuits.
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© 1988 Kluwer Academic Publishers, Boston
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McCalla, W.J. (1988). Statistical Analysis. In: Fundamentals of Computer-Aided Circuit Simulation. The Kluwer International Series in Engineering and Computer Science, vol 37. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-2011-1_8
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DOI: https://doi.org/10.1007/978-1-4613-2011-1_8
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4612-9199-2
Online ISBN: 978-1-4613-2011-1
eBook Packages: Springer Book Archive