Skip to main content

Abstract

With the EPMA and the SEM one can obtain quantitative analyses of ~1-ยต3 regions of bulk samples using a nondestructive x-ray technique. For samples in the form of thin foils and sections of organic material, the size of the analyzed microvolume is reduced to about one tenth of the value for bulk samples. For metals and alloys the ZAF technique is usually employed. Pure element or alloy standards can be used and the surfaces of the samples and standards must be properly prepared and analyzed under identical operating conditions. For geological samples the a factor or empirical technique is usually employed. For this class of samples secondary x-ray fluorescence is usually not significant and oxide standards of similar atomic number as the sample are used. Biological samples are often adversely affected by the impinging electron beam. It is important to ensure that the standards are in the same form and matrix as the specimen. The purpose of this chapter is to describe in some detail the various methods by which quantitative analyses can be obtained for inorganic, metallic, and biological samples in the form of bulk specimens, small particles, thin films, sections, and fractured surfaces.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 84.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

Copyright information

ยฉ 1981 Plenum Press,

About this chapter

Cite this chapter

Goldstein, J.I., Newbury, D.E., Echlin, P., Joy, D.C., Fiori, C., Lifshin, E. (1981). Quantitative X-Ray Microanalysis. In: Scanning Electron Microscopy and X-Ray Microanalysis. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-3273-2_7

Download citation

  • DOI: https://doi.org/10.1007/978-1-4613-3273-2_7

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4613-3275-6

  • Online ISBN: 978-1-4613-3273-2

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics