Abstract
Perhaps the most fascinating of all the techniques available for the study of surfaces is the field ion microscope inasmuch as it is the only technique capable of giving an image of the atoms themselves. It was developed from the earlier field emission microscope and has recently been given another dimension by the addition of a time-of-flight mass spectrometer. This latter combination has been described as the atom probe and it is well-named since it can locate and identify individual atoms in the sample surface.
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© 1974 Plenum Press, New York
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Kane, P.F. (1974). Field Ion Microscopy. In: Kane, P.F., Larrabee, G.B. (eds) Characterization of Solid Surfaces. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-4490-2_7
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DOI: https://doi.org/10.1007/978-1-4613-4490-2_7
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