Problem Diagnostics

Abstract

Manufacturing in the microelectronics industry is continuously pursuing higher quality, increased integration and lower cost. To remain competitive in this environment, companies must have a systematic methodology for controlling their manufacturing lines. Many diagnostic tools are used to maintain systematic control. Yield modeling helps set production goals which establish a framework for prioritizing problems for diagnostic focus. Process monitoring enables operators and engineers to detect problems in their infancy to minimize their business impact. Data systems provide product traceability for the isolation and analysis of problems. Sophisticated physical failure analysis techniques provide the tools needed to understand the physical relationship between product and process.