Abstract
At NIST in Boulder we have been pursuing an active research program developing diode-laser technology for scientific applications. Commercial diode lasers are readily available in a few wavelength bands in the red and near IR region of the spectrum. Our work has focused on the AlGaAs, InGaAlP, and InGaAsP lasers that operate at room temperature in the red and near IR region of the spectrum between 650 nm and 1.5 microns. These lasers have a number of recognized advantages, including: high efficiency, low cost, tunability, and moderate power levels (~1 to 100 mW). Increasing interest in applying diode lasers to science in general and spectroscopy in particular has stimulated a number of recent reviews on the subject.1–4
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References
J. Camparo, The diode laser in atomic physics, Contemp. Phys. 26, 443, (1985).
M. Ohtsu and T. Tako, Coherence in semiconductor lasers, in: “Progress in Optics XXV,” E. Wolf ed., Elsevier, p. 193, (1988).
J. Lawrenz, K. Niemax, A semiconductor diode laser spectrometer for laser spectrochemistry, Spectrochimica Acta. 44B, 155, (1989).
C. Wieman and L. Hollberg, Using diode lasers for atomic physics, Rev. Sci. Inst. 62,1, (1991).
E.M. Belenov, V.L. Velichansky, A.S. Zibrov, V.V. Nikitin, V.A. Sautenkov, V.A. Uskov, Methods for narrowing the emmision line of an injection laser, Sov. J. Quant. Elect. 13, 792, (1983).
A. Akul’shin, V. Bazhenov, V. Velichansky, M. Zverkov, A. Zibrov, V. Nikitin, O. Okhotnikov, V. Sautenkov, N. Senkov, E. Yurkin, Sov. J. Quant. Elect. .16, 912, (1986).
I.P. Kaminow, G. Eisenstein, and L.W. Stulz, Measurement of the Modal Reflectivity of an Antireflection Coating on a Superluminescent Diode, IEEE J. Quant. Elect. 19, No. 4, 493, (1983).
H. Ukita, K. Mise, and Y. Katagiri, Simple Measurement of the Reflectivity of Antireflection-Coated Laser Diode Facets, Jap. J. Appl. Phys. 27, L1128, (1988).
P. Zorabedian, W.R. Trutna Jr., and L.S. Cutler, Bistability in Grating-Tuned External Cavity Semiconductor Lasers, IEEE J. Quant. Elect. 23, 1855 (1987).
Mention of specific commercial laser products does not constitute an endorsement but is made to clarify the particulars of our experiments. Other devices may be better suited to this type of application.
G.C. Turk, J.C. Travis, J.R. DeVoe and T.C. O’Haver, Laser Enhanced Ionization Spectrometry in Analytical Flames, Anal. Chem. 51, No. 12, 1890 (1979).
L. Hollberg, R. Fox, N. Mackie, A.S. Zibrov, V.L. Velichansky, R. Ellingsen, and H.G.Robinson, Diode Lasers and Spectroscopic Applications, in: “Tenth International conference on Laser Spectroscopy,” M. Ducloy, E. Giacobino and G. Camy, p. 347, World Scientific, (1992).
B. Dahmani, L. Hollberg, R. Drullinger, Frequency stabilization of semiconductor lasers by resonant optical feedback, Opt. Lett. 12, 876, (1987).
Ph. Laurent, A. Clairon and Ch. Breant, Frequency Noise Analysis of Optically Self-Locked Diode Lasers, IEEE J. Quant. Elect. 25, No. 6, p. 1131, (1989).
H. Li and H.R. Teile, Efficient Frequency Noise Reduction of GaAlAs Semiconductor Lasers by Optical Feedback from an External High-Finesse Resonator, IEEE J. Quant. Elect. 25, No. 3, 257, (1989).
J. Hough, D. Hils,M. D. Rayman, Ma L.-S.,L. Hollberg, and J. L. Hall, Dye-Laser Frequency Stabilization Using Optical Resonators, Appl. Phys. B 33 ,179, (1984).
H.-U. Daniel, B. Maurer and M. Steiner, A broadband Schottky Point contact mixer for visible laser light and microwave harmonics, Appl. Phys. B 30, 189, (1983).
J.C. Bergquist, H.-U. Daniel, A wideband frequency-offset-locked dye laser spectrometer using a Schottky barrier mixer, Opts. Comm. 48, 327, 1984.
A.M. Akulshin, A.A. Celikov and V.L. Velichansky, Nonlinear Doppler-free spectroscopy of the 61S0–63P1 intercombination transition in barium, Optics Comm. 93, 54 (1992).
G.M. Tino, M. Barsanti, M. de Angelis, L. Gianfrani and M. Ingusicio, Spectroscopy of the 689nm intercombination line of strontium using and extended-cavity InGaP/InGaAlP diode laser, Appl. Phys. B 55, 397, (1992).
J.C. Bergquist, R.L. Barger and D.J. Glaze, in: “Laser Spectroscopy IV,” H. Walther and K.W. Rothe eds., Springer-Verlag, p. 120, (1979).
J. Helmcke, A. Morinaga, J. Ishikawa and F. Riehle, Optical Frequency Standards, IEEE Trans. Inst. Meas. 38, 524, (1989).
N. Beverini, F. Giammanco, E. Maccioni, F. Strumia, and G. Vissani, Measurement of the calcium 1P1–1D2 transition rate in a laser-cooled atomic beam, J. Opt. Soc. Am. B 6, No. 11, p. 2188, (1989).
T. Kurosu, F. Shimizu, Laser Cooling and Trapping of Calcium and Strontium, Jap.J. Appl. Phys. 29, L2127, (1990).
T. Andreae, W. König, R. Wynands, D. Leibfried, F. Schmidt-Kaler, C. Zimmermann, D. Meschede, and T.W. Hansch, Absolute Frequency Measurement of the Hydrogen 1S-2S Transition and a New Value for the Rydberg Constant, Phys. Rev. Lett. 69, 1923, (1992).
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Fox, R. et al. (1993). Diode Lasers and Metrology. In: Inguscio, M., Wallenstein, R. (eds) Solid State Lasers. NATO ASI Series, vol 317. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-2998-9_19
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DOI: https://doi.org/10.1007/978-1-4615-2998-9_19
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