Abstract
This chapter presents the information needed to design, manufacture and test microelectronic devices which are encapsulated in“plastic” molding compound. The chapter begins with an historical overview, then discusses advantages and disadvantages of plastic versus ceramic packaging. The next three sections present the materials, manufacturing processes for molding and the handling methods of the finished product. This is followed by a section on test and reliability issues. The chapter concludes with a view of the future of plastic encapsulated microcircuits. The interested reader is referred to the books titled“Plastic Encapsulated Microcircuits ” [1], and“Integrated Circuit, Hybrid and Multichip Module Design Guidelines” [2] for more detailed information.
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References
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Additional Readings
C. Bloomer, R. L. Franz, M. J. Johnson, S. Kent, B. Mepham, S. Smith, R. M. Sonnicksen, and L. S. Walker. “Failure Mechanisms in Through-Hole Packages,” in Electronic Materials Handbook, 1, Packaging, ed. by M. L. Minges, pp. 969–981, ASM International, Materials Park, OH 1989
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Pecht, M.G., Nguyen, L.T. (1997). Plastic Packaging. In: Tummala, R.R., Rymaszewski, E.J., Klopfenstein, A.G. (eds) Microelectronics Packaging Handbook. Springer, Boston, MA. https://doi.org/10.1007/978-1-4615-6037-1_4
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