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Intensity Dependent Absorption in Semiconductors

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Physical Processes in Laser-Materials Interactions

Part of the book series: NATO Advanced Study Institutes Series ((NSSB,volume 84))

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Abstract

Laser calorimetry has been used to study intensity dependent absorption process in semiconductors at 1.06 and 1.318 µm. New measurements of two photon absorption and two photon excited free carriers are reported. Saturation of the one photon absorption has been observed and evidence is presented for a pulse width dependence of the two photon absorption.

A version of this paper appears in the December 15, 1980 issue of Applied Physics Letters.

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References

  1. M. Bass, E. W. Van Stryland, and A. F. Stewart., Appl. Phys. Lett., 34(2):142 (1979).

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  4. M. Born and E. Wolf/ “ Principles of Optics”, Pergamon, Oxford, p. 256 (1975).

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  5. R. H. Bube,“ Photoconductivity and Related Phenomena”, J. Mort and D. M. Pai, eds., Elsevier Scientific, New York, p. 118 (1976).

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  6. A. F. Stewart, Ph.D. thesis, University of Southern California, 1980, (unpublished).

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  7. J. H. Bechtel and W. L. Smith, Phys. Rev. B, 13:3515 (1976).

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  8. J. F. Reintjes and J. C. McGraddy, Phys. Rev. Lett., 30:901 (1973). These authors considered the possibility of a resonant TPA process.

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Author information

Authors and Affiliations

  1. Center for Laser Studies, University of Southern California, University Park, Los Angeles, California, 90007, USA

    Alan F. Stewart & Michael Bass

Authors
  1. Alan F. Stewart
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  2. Michael Bass
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Editor information

Editors and Affiliations

  1. Institute of Physics, University of Rome, Rome, Italy

    M. Bertolotti

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© 1983 Plenum Press, New York

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Stewart, A.F., Bass, M. (1983). Intensity Dependent Absorption in Semiconductors. In: Bertolotti, M. (eds) Physical Processes in Laser-Materials Interactions. NATO Advanced Study Institutes Series, vol 84. Springer, Boston, MA. https://doi.org/10.1007/978-1-4684-4322-6_17

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  • DOI: https://doi.org/10.1007/978-1-4684-4322-6_17

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4684-4324-0

  • Online ISBN: 978-1-4684-4322-6

  • eBook Packages: Springer Book Archive

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