Abstract
We know that SAD, while giving us useful information about the specimen, has two severe limitations:
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We have to be very cautious in interpreting SAD patterns from areas which are less than ~0.5 lam in diameter. This size is large compared to the dimensions of many crystalline features that interest us in materials science (Chapter 16).
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SAD patterns contain only rather imprecise two-dimensional crystallographic information because the Bragg conditions are relaxed for a thin specimen and small grains within the specimen (Chapter 17).
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References
General References
Loretto, M.H. (1994) Electron Beam Analysis of Materials, 2nd edition, Chapman and Hall, London.
Steeds, J.W. (1979) Introduction to Analytical Electron Microscopy (Eds. J.J. Hren, J.I. Goldstein, and D.C. Joy), p. 387, Plenum Press, New York.
Sung, C.M. and Williams, D.B. (1991) J. Electron Microsc. Tech. 17, 95. Williams, D.B. (1987) Practical Analytical Electron Microscopy in Materials Science, 2nd edition, p. 117, Philips Electron Optics Publishing Group, Mahwah, New Jersey.
Specific References
Ayer, R. (1989) J. Electron Microsc. Tech. 13, 16.
Eades, J.A., Moore, S., Pfullman, T., and Hangas, J. (1993) Microscopy Research and Technique, 24, 509.
Ecob, R.C., Shaw, M.P., Porter, A.J., and Ralph, B. (1981) Phil. Mag. A44, 1117.
Heilman, P., Clark, W.A.T., and Rigney, D.A. (1983) Acta Met. 31, 1293.
Jones, P.M., Rackham, G.M., and Steeds, J.W. (1977) Proc. Roy. Soc. A354, 197.
Kossel, W. and Möllenstedt, G. (1939) Ann. der Phys. 36, 113. LePoole, J.B. (1947) Philips Tech. Rundsch. 9, 33.
Raghavan, M., Scanlon, J.C., and Steeds, J.W. (1984) Met. Trans. 15A, 1299.
Reimer, L. (1993) Transmission Electron Microscopy; Physics of Image Formation and Microanalysis, 3rd edition, Springer-Verlag, New York.
Steeds, J.W. (1981) Quantitative Microanalysis with High Spatial Resolution (Eds. G.W. Lorimer, M.H. Jacobs, and P. Doig), p. 210, The Metals Society, London.
Turner, J.H. and Krishnan, K.M. (1987) J. Electron Microsc. Tech. 5, 211.
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Williams, D.B., Carter, C.B. (1996). Obtaining CBED Patterns. In: Transmission Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-2519-3_20
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DOI: https://doi.org/10.1007/978-1-4757-2519-3_20
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