Abstract
When we need to obtain information about the specimen in two directions, we need to align the specimen so the beam is close to a low-index zone axis. If the HRTEM image information is going to be directly interpretable, the specimen must be oriented with the incident beam exactly aligned with both the TEM’s optic axis and the specimen’s zone axis. Thus we will have many reflections excited and the simple two-beam analysis of Chapter 27 cannot be used.
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References
General References
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Williams, D.B., Carter, C.B. (1996). Image Simulation. In: Transmission Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-2519-3_29
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DOI: https://doi.org/10.1007/978-1-4757-2519-3_29
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