Skip to main content

Abstract

Elastically scattered electrons are the major source of contrast in TEM images and they also create the intensity distributions in diffraction patterns, so we need to understand what controls this process. We’ll consider elastic scattering first from single isolated atoms and then from many atoms together in the specimen. To comprehend elastic scattering we need to invoke both particle and wave aspects of the character of the electron.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 74.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

General References

  • Andrews, K.W., Dyson, D.J., and Keown, S.R. (1967) Electron Diffraction Patterns, The Institute of Physics, Bristol, United Kingdom.

    Google Scholar 

  • Henoc, J. and Maurice, F., Eds. (1976) Use of Monte Carlo Calculations, NBS Special Publication 460, Washington, DC.

    Google Scholar 

  • Kyser, D., Ed. (1984) Electron-Beam Specimen Interactions for Microscopy, Microanalysis and Lithography, SEM Inc., AMF O’Hare, Illinois.

    Google Scholar 

Specific References

  • Doyle, P.A. and Turner, P.S. (1968) Acta Cryst. A24, 390.

    Article  CAS  Google Scholar 

  • Hall, C.E. (1953) Introduction to Electron Microscopy, p. 229, McGraw-Hill, New York.

    Google Scholar 

  • Joy, D.C., Romig, A.D. Jr., and Goldstein, J.L, Eds. (1986) Principles of Analytical Electron Microscopy, p. 6, Plenum Press, New York.

    Google Scholar 

  • Reimer, L. (1993) Transmission Electron Microscopy, 3rd edition, Springer-Verlag, New York.

    Google Scholar 

  • Rutherford, E. (1911) Phil. Mag. 21, 669.

    CAS  Google Scholar 

  • Taylor, C. (1987) Diffraction, Adam Hilger, Bristol, United Kingdom.

    Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Rights and permissions

Reprints and permissions

Copyright information

© 1996 Springer Science+Business Media New York

About this chapter

Cite this chapter

Williams, D.B., Carter, C.B. (1996). Elastic Scattering. In: Transmission Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-2519-3_3

Download citation

  • DOI: https://doi.org/10.1007/978-1-4757-2519-3_3

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-0-306-45324-3

  • Online ISBN: 978-1-4757-2519-3

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics