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Design of Josephson Junctions for X-Ray Detection with Small Quasiparticle Loss at the Edges

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Advances in Cryogenic Engineering Materials

Part of the book series: An International Cryogenic Materials Conference Publication ((ACRE,volume 40))

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Abstract

Using Nb/Al technology, we are developing Josephson junctions for high-resolution X-ray spectroscopy. Quasiparticle loss due to trapping in the anodized edges of the present junctions degrades the X-ray energy resolution. We present the design and fabrication process of a new junction geometry that aims to minimize this kind of quasiparticle loss. The I-V characteristics of the new junctions indicate good junction quality.

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References

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Author information

Authors and Affiliations

  1. Department of Applied Physics, University of Twente, Enschede, The Netherlands

    J. G. Gijsbertsen, E. P. Houwman, J. Flokstra & H. Rogalla

Authors
  1. J. G. Gijsbertsen
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  2. E. P. Houwman
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  3. J. Flokstra
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  4. H. Rogalla
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Editor information

Editors and Affiliations

  1. Cryogenic Materials, Inc., Boulder, Colorado, USA

    Richard P. Reed

  2. U.S. Department of Commerce, National Institute of Standards and Technology, Boulder, Colorado, USA

    Fred R. Fickett

  3. National High Magnetic Field Laboratory, Florida State University, Tallahassee, Florida, USA

    Leonard T. Summers

  4. MS Publications, Boulder, Colorado, USA

    M. Stieg

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© 1994 Springer Science+Business Media New York

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Gijsbertsen, J.G., Houwman, E.P., Flokstra, J., Rogalla, H. (1994). Design of Josephson Junctions for X-Ray Detection with Small Quasiparticle Loss at the Edges. In: Reed, R.P., Fickett, F.R., Summers, L.T., Stieg, M. (eds) Advances in Cryogenic Engineering Materials . An International Cryogenic Materials Conference Publication, vol 40. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-9053-5_45

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  • DOI: https://doi.org/10.1007/978-1-4757-9053-5_45

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4757-9055-9

  • Online ISBN: 978-1-4757-9053-5

  • eBook Packages: Springer Book Archive

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