Abstract
The study of the double ionization of atoms or molecules by electron impact is a powerful tool in investigating finer details of the ionization process. This double ionization by electron impact is due to different processes:
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direct process consisting to a simultaneous double ionization of two electrons via different mechanisms
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indirect process resulting of an ionization of a single inner-shell electron followed by Auger decay
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resonant processes in collisions with positive ions referred to as-called resonant excitation-autoionization process which lead to a final emission of three electrons (the incident one is captured by the target ion and ejected with two target electrons).
We restrict here to the double ionization of helium by electron impact which only involves direct process.
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Dal Cappello, C., El M’Khanter, R., Lamy, P. (1997). Double Ionization of Helium by Electron Impact: A Study of the Two-Step Mechanism. In: Whelan, C.T., Walters, H.R.J. (eds) Coincidence Studies of Electron and Photon Impact Ionization. Physics of Atoms and Molecules. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-9751-0_8
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DOI: https://doi.org/10.1007/978-1-4757-9751-0_8
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