Abstract
Superlattice thin films of Cu-Ni (50 atomic percent Cu-50 atomic percent Ni) with bilayer repeat lengths between 1.6 and 19.4 nm were produced by ion beam sputtering. The films were characterized by x-ray diffractometry, from which the bilayer repeat length and the average lattice parameter perpendicular to the plane of the film were determined. The average lattice parameter displayed a small increase as the bilayer repeat length was reduced. Films were also investigated using low load indentation methods. Such methods produce submicron deep indents, and leave most of the film unaffected, and as such can be considered nondestructive characterization techniques. A small enhancement above the rule of mixtures value of the effective elastic modulus of the films was observed (independent of the bilayer repeat length); however, a large enhancement in the hardness was measured for small bilayer repeat lengths. This hardness enhancement was attributed to an interface hardening effect. This behavior suggests that metallic superlattices may be have applications as high strength coatings or thin films.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
C. Kim, S. B. Qadri, M. Twigg, and A. S. Edelstein, Synthesis and structural properties of ion-beam sputtered Cu-Ni multilayers, J. Vac. Sci. Technol. (in press).
B. M. Clemens and G. L. Eesley, “Relationship between interfacial strain and the elastic response of multilayered metal films,” Phys. Rev. Lett. 61:2356 (1988).
R. C. Cammarata and K. Sieradzki, “Effects of surface stress on the elastic moduli of thin films and superlattices,” Phys. Rev. Lett. 62:2005 (1990).
M. F. Doerner and W. D. Nix, “A method for interpreting the data from depth-sensing indentation instruments,” J. Mater. Res. 1:601 (1986).
T. Tsakalakos and J. E. Hilliard, “Elastic modulus in composition-modulated copper-nickel foils,” J. Appl. Phvs. 54:734 (1983).
D. Baral, J. B. Ketterson, and J. E. Hilliard, “Mechanical and thermoelectric behavior of composition modulated foils,” in “Modulated Structure Materials,” T. Tsakalakos, ed., Martinus Nijhoff, Dordrecht (1984).
B. S. Berry and W. C. Pritchett, “Effect of interdiffusion on the elasticity and internal friction of compositionally modulated copper-nickel thin films,” Thin Solid Films 33:19 (1976).
H. Itozaki, Ph. D. Thesis, Northwestern University (1982).
A. Moreau, J. B. Ketterson, and J. Mattson, “New measurements of the elastic properties of composition modulated Cu-Ni thin films,” Appl. Phys. Lett. 56:1959 (1990).
R. C. Cammarata, T. E. Schlesinger, C. Kim, S. B. Qadri, and A. S. Edelstein, “Nanoindentation study of the mechanical properties of copper-nickel multilayered thin films,” Appl. Phys. Lett. 56:1864 (1990).
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1991 Springer Science+Business Media New York
About this chapter
Cite this chapter
Schlesinger, T.E., Cammarata, R.C., Kim, C., Qadri, S.B., Edelstein, A.S. (1991). Nondestructive Characterization of the Structure and Mechanical Properties of Metallic Superlattice Thin Films. In: Ruud, C.O., Bussière, J.F., Green, R.E. (eds) Nondestructive Characterization of Materials IV. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-0670-0_2
Download citation
DOI: https://doi.org/10.1007/978-1-4899-0670-0_2
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4899-0672-4
Online ISBN: 978-1-4899-0670-0
eBook Packages: Springer Book Archive