Abstract
It is well accepted that variations have huge impacts on circuit performance, yield, and reliability in the nanometer regime. Analog and mixed-signal circuits are especially sensitive to process variations as a lot of matching and regularities are required.
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© 2014 Springer Science+Business Media New York
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Shi, G., Tan, S.XD., Tlelo Cuautle, E. (2014). Performance Bound Analysis of Analog Circuits Considering Process Variations. In: Advanced Symbolic Analysis for VLSI Systems. Springer, New York, NY. https://doi.org/10.1007/978-1-4939-1103-5_11
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DOI: https://doi.org/10.1007/978-1-4939-1103-5_11
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Publisher Name: Springer, New York, NY
Print ISBN: 978-1-4939-1102-8
Online ISBN: 978-1-4939-1103-5
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