Abstract
Scanning probe microscopy data usually have the form of a matrix where the topography (height) or some other signal such as the phase in dynamic AFM is measured as a function of the lateral xy-position on the surface. Data representation is the task to map the heights (i.e. the output of the z-controller) to gray levels in an image in an optimal way. Image processing is used in order to enhance the image representation further, i.e. by removing image artifacts such as high-frequency noise, noise pixels or noise lines (Klapetek, Quantitative data processing in scanning probe microscopy, 2nd edn. Elsevier, Amsterdam, 2018, [1]; Eaton, Batziou, Artifacts and practical issues in atomic force microscopy. In: Santos N, Carvalho F (eds) Atomic force microscopy. Methods in molecular biology, vol. 1886. Humana Press, New York, 2019, [2]).
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References
P. Klapetek, Quantitative Data Processing in Scanning Probe Microscopy, 2nd edn. (Elsevier, Amsterdam, 2018). ISBN 9780128133477
P. Eaton, K. Batziou, Artifacts and practical issues in atomic force microscopy, in Atomic force microscopy, ed. by N. Santos, F. Carvalho. Methods in Molecular Biology, vol. 1886 (Humana Press, New York, 2019). ISBN 978-1-4939-8893-8. https://doi.org/10.1007/978-1-4939-8894-5_1
J.C. Russ, F.B. Neal, The Image Processing Handbook, 7th edn. (CRC Press, Boca Raton, 2017). ISBN 9781138747494
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Voigtländer, B. (2019). Data Representation and Image Processing. In: Atomic Force Microscopy. NanoScience and Technology. Springer, Cham. https://doi.org/10.1007/978-3-030-13654-3_7
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DOI: https://doi.org/10.1007/978-3-030-13654-3_7
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