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A Novel Coupled Metric Learning Method and Its Application in Degraded Face Recognition

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Biometric Recognition (CCBR 2013)

Part of the book series: Lecture Notes in Computer Science ((LNIP,volume 8232))

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Abstract

The coupled metric learning is a novel metric method to solve the matching problem of the elements in different data sets. In this paper, we improved the supervised locality preserving projection algorithm, and added within-class and between-class information of this algorithm to coupled metric learning, so a novel coupled metric learning method is proposed. This method can effectively extract the nonlinear feature information, and the operation is simple. The experiments based on two face databases are performed. The results show that, the proposed method can get higher recognition rate in low-resolution and fuzzy face recognition, and can reduce the computing time; it is an effective metric method.

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References

  1. Davis, J.V., Kulis, B., Jain, P., et al.: Information-theoretic metric learning. In: The 24th International Conference on Machine Learning, pp. 209–216. ACM Press, Oregon (2007)

    Google Scholar 

  2. Shiming, X., Feiping, N., Changshui, Z.: Learning a Mahalanobis distance metric for data clustering and classification. Pattern Recognition 41(12), 3600–3612 (2008)

    Article  MATH  Google Scholar 

  3. Weinberger, K.Q., Saul, L.K.: Distance metric learning for large margin nearest neighbor classification. The Journal of Machine Learning Research 10, 207–244 (2009)

    MATH  Google Scholar 

  4. Kulis, B., Jain, P., Grauman, K.: Fast similarity search for learned metrics. IEEE Transactions on Pattern Analysis and Machine Intelligence 31(12), 2143–2157 (2009)

    Article  Google Scholar 

  5. Zhengping, H., Liang, L., Chengqian, X., et al.: Sparse Distance Metric Learning with L1-Norm Constraint for One-Class Samples in High-Dimensional Space and Its Application. Mathematics in Practice and Theory 41(6), 116–124 (2011)

    MATH  Google Scholar 

  6. Lei, W., Tie, L., Huading, J.: Chunk Incremental Distance Metric Learning Algorithm Based on Manifold Regularization. Acta Electronic Sinica 39(5), 1131–1135 (2011)

    Google Scholar 

  7. Mahdieh, S.B., Saeed, B.S.: Kernel-based metric learning for semi-supervised clustering. Neurocomputing 73, 1352–1361 (2010)

    Article  MATH  Google Scholar 

  8. Hotelling, H.: Analysis of A Complex of Statistical Variables into Principal Components. Journal of Educational Psychology 24, 417–441 (1933)

    Article  MATH  Google Scholar 

  9. Fisher, R.A.: The Use of Multiple Measurements in Taxonomic Problems. Annals of Eugenics 7, 179–188 (1936)

    Article  Google Scholar 

  10. Comon, P., et al.: Independent Components Analysis, a New Concept. Signal Procssing 36(3), 287–314 (1994)

    Article  MATH  Google Scholar 

  11. Roweis, S.T., Saul, L.K.: Nonlinear Dimensionality Reduction by Locally Linear Embedding. Science 290, 2323–2326 (2000)

    Article  Google Scholar 

  12. Tenenbaum, J., Silva, V., Langford, J.: A Global Geometric Framework for Nonlinear Dimensionality Reduction. Science 290, 2319–2323 (2000)

    Article  Google Scholar 

  13. Belkin, M., Niyogi, P.: Laplacian Eigenmaps and Spectral Techniques for Embedding and Clustering. Advances in Neural Information Processing System 14, 585–591 (2002)

    Google Scholar 

  14. Li, B., Chang, H., Shan, S., Chen, X.: Coupled Metric Learning for Face Recognition with Degraded Images. In: Zhou, Z.-H., Washio, T. (eds.) ACML 2009. LNCS, vol. 5828, pp. 220–233. Springer, Heidelberg (2009)

    Chapter  Google Scholar 

  15. Xianye, B., Weixiao, M., Rui, Y., et al.: An improved biometrics technique based on metric learning approach. Neurocomputing 79(11), 44–51 (2012)

    Google Scholar 

  16. Li, B., Chang, H., Shan, S., et al.: Low-Resolution Face Recognition via Coupled Locality Preserving Mappings. IEEE Signal Processing Letters 17(1), 20–23 (2010)

    Article  Google Scholar 

  17. Zhonghua, S., Yonghui, P., et al.: A Supervised Locality Preserving Projection Algorithm for Dimensionality Reduction. Pattern Recognition and Artificial Intelligence 21(2), 233–239 (2008)

    Google Scholar 

  18. Yuanyuan, W., Zhimin, S., Zheng, C., et al.: Super-resolution image restoration based on maximum likelihood estimation. Chinese Journal of Scientific Instrument 29(5), 949–953 (2008)

    Google Scholar 

  19. Xiaofei, Y., Fujie, C., Xuejun, Y.: Template matching by wiener filtering. Journal of Computer Research & Development 37(12), 1499–1503 (2000)

    Google Scholar 

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Zou, G., Jiang, S., Zhang, Y., Fu, G., Wang, K. (2013). A Novel Coupled Metric Learning Method and Its Application in Degraded Face Recognition. In: Sun, Z., Shan, S., Yang, G., Zhou, J., Wang, Y., Yin, Y. (eds) Biometric Recognition. CCBR 2013. Lecture Notes in Computer Science, vol 8232. Springer, Cham. https://doi.org/10.1007/978-3-319-02961-0_19

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  • DOI: https://doi.org/10.1007/978-3-319-02961-0_19

  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-02960-3

  • Online ISBN: 978-3-319-02961-0

  • eBook Packages: Computer ScienceComputer Science (R0)

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