Abstract
Position sensors with nanometer resolution are a key component of many precision imaging and fabrication machines.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Notes
- 1.
In a two-varying-element bridge circuit, the nonlinearity due to \(\Delta R/2\) in Eq. (5.34) is 0.5 % nonlinearity per percent of strain (Kester 2002). Since the maximum strain of a piezoelectric actuator is 0.1 %, the maximum nonlinearity is only 0.05 % and can be neglected. If this magnitude of nonlinearity is not tolerable, compensating circuits are available (Kester 2002)
References
Abramovitch DY, Andersson SB, Pao LY, Schitter G (2007) A tutorial on the mechanisms, dynamics, and control of atomic force microscopes. In: Proceedings of American control conference, New York City, NY, pp 3488–3502, July 2007
Ando T, Uchihashi T, Fukuma T (2008) High-speed atomic force microscopy for nano-visualization of dynamic biomolecular processes. Prog Surf Sci 83(7–9):337–437
Barlian A, Park W-T, Mallon J, Rastegar A, Pruitt B (2009) Review: semiconductor piezoresistance for microsystems. Proc IEEE 97(3):513–552
Baxter LK (1997) Capacitive sensors: design and applications. IEEE Press, Piscataway
Borionetti G, Bazzalia A, Orizio R (2004) Atomic force microscopy: a powerful tool for surface defect and morphology inspection in semiconductor industry. Eur Phys J Appl Phys 27(1–3):101–106
Brown RG, Hwang PYC (1997) Introduction to random signals and applied kalman filtering. Wiley, New York
Butler H (2011) Position control in lithographic equipment. IEEE Control Syst 31(5):28–47
Chassagne L, Wakim M, Xu S, Topçu S, Ruaux P, Juncar P, Alayli Y (2007) A 2d nano-positioning system with sub-nanometric repeatability over the millimetre displacement range. Meas Sci Technol 18(11):3267–3272
Chen BM, Lee TH, Peng K, Venkatarmanan V (2006) Hard disk drive servo system. Springer, London
Chu LL, Gianchandani YB (2003) A micromachined 2d positioner with electrothermal actuation and sub-nanometer capacitive sensing. J Micromech Microeng 13(2):279–285
Chu C-L, Fan S-H (2006) A novel long-travel piezoelectric-driven linear nanopositioning stage. Precis Eng 30(1):85–95
Devasia S, Eleftheriou E, Moheimani SOR (2007) A survey of control issues in nanopositioning. IEEE Trans Control Syst Technol 15(5):802–823
DiBiasio CM, Culpepper ML (2008) Design of a meso-scale six-axis nanopositioner with integrated position sensing. In: Proceedings 5th annual international symposium on nanomanufacturing, Singapore
Dong W, Sun LN, Du ZJ (2007) Design of a precision compliant parallel positioner driven by dual piezoelectric actuators. Sens Actuators A 135(1):250–256
Dukes JN, Gordon GB (1970) A two hundred-foot yardstick with graduations every microinch. Hewlett-Packard J 21(2):2–8
van Etten WC (2005) Introduction to noise and random processes. Wiley, West Sussex
Fantner GE, Schitter G, Kindt JH, Ivanov T, Ivanova K, Patel R, Holten-Andersen N, Adams J, Thurner PJ, Rangelow IW, Hansma PK (2006) Components for high speed atomic force microscopy. Ultramicroscopy 106(2–3):881–887
FASTRACK high-accuracy linear encoder scale system. Data sheet l-9517-9356-01-b. Online: www.renishaw.com.
Fericean S, Droxler R (2007) New noncontacting inductive analog proximity and inductive linear displacement sensors for industrial automation. IEEE Sens J 7(11):1538–1545
Ferreira A, Mavroidis C (2006) Virtual reality and haptics for nanorobotics. IEEE Robot Autom Mag 13(3):78–92
Fleming AJ (2012a) Estimating the resolution of nanopositioning systems from frequency domain data. In: Proceedings IEEE international conference on robotics and automation, St. Paul, MN, pp 4786–4791, May 2012
Fleming AJ (2012b) Measuring picometer nanopositioner resolution. In: Proceedings of Actuator 2012, 13th international conference on new actuators, Bremen, June 18–20 2012
Fleming AJ, Moheimani SOR (2005) Control oriented synthesis of high performance piezoelectric shunt impedances for structural vibration control. IEEE Trans Control Syst Technol 13(1):98–112
Fleming AJ, Wills AG, Moheimani SOR (2008) Sensor fusion for improved control of piezoelectric tube scanners. IEEE Trans Control Syst Technol 15(6):1265–6536
Fleming AJ, Kenton BJ, Leang KK (2010) Bridging the gap between conventional and video-speed scanning probe microscopes. Ultramicroscopy 110(9):1205–1214
Fleming AJ, Aphale SS, Moheimani SOR (2010) A new method for robust damping and tracking control of scanning probe microscope positioning stages. IEEE Trans Nanotechnol 9(4):438–448
Fleming AJ, Leang KK (2010) Integrated strain and force feedback for high performance control of piezoelectric actuators. Sens Actuators A 161(1–2):256–265
Fleming AJ (2010) Nanopositioning system with force feedback for high-performance tracking and vibration control. IEEE Trans Mechatron 15(3):433–447
Fleming AJ (2011) Dual-stage vertical feedback for high speed-scanning probe microscopy. IEEE Trans Control Syst Technol 19(1):156–165
Fleming AJ (2012) A method for measuring the resolution of nanopositioning systems. Rev Sci Instrum 83(8):086101
Fraden J (2004) Handboook of modern sensors: physics, designs, and applications. Springer, New York
Guliyev E, Michels T, Volland B, Ivanov T, Hofer M, Rangelow I (2012) High speed quasi-monolithic silicon/piezostack spm scanning stage. Microelectron Eng 98:520–523
Hariharan P (2007) Basics of interferometry, 2nd edn. Academic Press, London
Heidenhain exposed linear encoders. Online: www.heidenhain.com.
Hicks TR, Atherton PD, Xu Y, McConnell M (1997) The nanopositioning book. Queensgate Intstruments Ltd, Berkshire
Humphris A, McConnell M, Catto D (2006) A high-speed atomic force microscope capable of video-rate imaging. Microscopy and analysis: SPM supplement, pp 29–31, Mar 2006
ISO 5725 (1994) Accuracy (trueness and precision) of measurement methods and results
ISO/IEC Guide 98:1993 (1994) Guide to the expression of uncertainty in measurement. Interational Organization for Standardization
JCGM 200:2008 (2008) International vocabulary of metrology basic and general concepts and associated terms (VIM), 3rd edn
Karrai K, Braun P (2010) Miniature long-range laser displacement sensor. In: Proceedings Actuator Conference, Bremen, pp 285–288, June 2010
Kartik V, Sebastian A, Tuma T, Pantazi A, Pozidis H, Sahoo DR (2012) High-bandwidth nanopositioner with magnetoresistance based position sensing. Mechatronics 22(3):295–301
Kester W (2002) Sensor signal conditioning. Analog Devices, Newnes
Khiat A, Lamarque F, Prelle C, Pouille P, Leester-Schädel M, Büttgenbach S (2010) Two-dimension fiber optic sensor for high-resolution and long-range linear measurements. Sens Actuators A Phys 158(1):43–50
Kim M, Moon W, Yoon E, Lee K-R (2006) A new capacitive displacement sensor with high accuracy and long-range. Sens Actuators A Phys 130–131(14):135–141
Kobayashi M, Sumitomo K, Torimitsu K (2007) Real-time imaging of DNA streptavidin complex formation in solution using a high-speed atomic force microscope. Ultramicroscopy 107(2–3):184–190
Kovacs GTA (1998) Micromachined transducers sourcebook. McGraw Hill, Boston
Kuijpers AA, Krijnen GJM, Wiegerink RJ, Lammerink TSJ, Elwenspoek M (2003) 2d-finite-element simulations for long-range capacitive position sensor. J Micromech Microeng 13(4):S183–S189
Kuijpers AA, Krijnen GJM, Wiegerink RJ, Lammerink TSJ, Elwenspoek M (2006) A micromachined capacitive incremental position sensor: part 1 analysis and simulations. J Micromech Microeng 16(6):S116–S124
Kuijpers AA, Krijnen GJM, Wiegerink RJ, Lammerink TSJ, Elwenspoek M (2006) A micromachined capacitive incremental position sensor: part 2 experimental assessment. J Micromech Microeng 16(6):S125–S134
Lantz MA, Binnig GK, Despont M, Drechsler U (2005) A micromechanical thermal displacement sensor with nanometre resolution. Nanotechnology 16(8):1089–1094
Leang KK, Zou Q, Devasia S (2009) Feedforward control of piezoactuators in atomic force microscope systems. Control Syst Mag 29(1):70–82
Lee J-Y, Chen H-Y, Hsu C-C, Wu C-C (2007) Optical heterodyne grating interferometry for displacement measurement with subnanometric resolution. Sens Actuators A Phys 137(1):185–191
Lee J-I, Huang X, Chu P (2009) Nanoprecision MEMS capacitive sensor for linear and rotational positioning. J Microelectromech Syst 18(3):660–670
Lee S-C, Peters RD (2009) Nanoposition sensors with superior linear response to position and unlimited travel ranges. Rev Sci Instrum 80(4):045109
Li Q, Ding F (2005) Novel displacement eddy current sensor with temperature compensation for electrohydraulic valves. Sens Actuators A Phys 122(1):83–87
Lu T-F, Handley D, Yong YK (2004) Position control of a 3 dof compliant micro-motion stage. In: Proceedings control, automation, robotics and vision conference, vol 2, pp 278–1274
Maess J, Fleming AJ, Allgöwer F (2008) Simulation of dynamics-coupling in piezoelectric tube scanners by reduced order finite element models. Rev Sci Instrum 79:015105
Merry R, Uyanik M, van de Molengraft R, Koops R, van Veghel M, Steinbuch M (2009) Identification, control and hysteresis compensation of a 3 DOF metrological AFM. Asian J Control 11(2):130–143
Merry R, Maassen M, van de Molengraft M, van de Wouw N, Steinbuch M (2011) Modeling and waveform optimization of a nano-motion piezo stage. IEEE/ASME Trans Mechatron 16(4):615–626
Messenger R, Aten Q, McLain T, Howell L (2009) Piezoresistive feedback control of a mems thermal actuator. J Microelectromech Syst 18(6):1267–1278
Michellod Y, Mullhaupt P, Gillet D (2006) Strategy for the control of a dual-stage nano-positioning system with a single metrology. In: Proceedings on robotics, automation and mechatronics, pp 1–8, June 2006
Mishra S, Coaplen J, Tomizuka M (2007) Precision positioning of wafer scanners: segmented iterative learning control for nonrepetitive disturbances. IEEE Control Syst 27(4):20–25
Moheimani SOR, Fleming AJ (2006) Piezoelectric transducers for vibration control and damping. Springer, London
Nyce DS (2004) Linear position sensors: theory and application. Wiley, Hoboken
Pantazi A, Sebastian A, Cherubini G, Lantz M, Pozidis H, Rothuizen H, Eleftheriou E (2007) Control of mems-based scanning-probe data-storage devices. IEEE Trans Control Syst Technol 15(5):824–841
Parkin S, Jiang X, Kaiser C, Panchula A, Roche K, Samant M (2003) Magnetically engineered spintronic sensors and memory. Proc IEEE 91(5):661–680
Picco LM, Bozec L, Ulcinas A, Engledew DJ, Antognozzi M, Horton M, Miles MJ (2007) Breaking the speed limit with atomic force microscopy. Nanotechnology 18(4):044030(1–4)
Preumont A (2006) Mechatronics: dynamics of electromechanical and piezoelectric systems. Springer, Heidelberg
Proksch R, Cleveland J Bocek D (2007) Linear variable differential transformers for high precision position measurements. US Patent 7,262,592, 2007
Roach SD (1998) Designing and building an eddy current position sensor. Sensors, Sept 1998. http://www.sensorsmag.com/sensors/electric-magnetic/designing-and-building-eddy-current-position-sensor-772
Sahoo DR, Sebastian A, Häberle W, Pozidis H, Eleftheriou E (2011) Scanning probe microscopy based on magnetoresistive sensing. Nanotechnology 22(14):145501
Salapaka SM, Salapaka MV (2008) Scanning probe microscopy. IEEE Control Syst Mag 28(2):65–83
Schitter G, Stark RW, Stemmer A (2002) Sensors for closed-loop piezo control: strain gauges versus optical sensors. Meas Sci Technol 13:N47–N48
Schitter G, Åström KJ, DeMartini BE, Thurner PJ, Turner KL, Hansma PK (2007) Design and modeling of a high-speed AFM-scanner. IEEE Trans Control Syst Technol 15(5):906–915
Schitter G, Thurner PJ, Hansma PK (2008) Design and input-shaping control of a novel scanner for high-speed atomic force microscopy. Mechatronics 18(5–6):282–288
Sebastian A, Pantazi A, Pozidis H, Elefthriou E (2008) Nanopositioning for probe-based data storage. IEEE Control Syst Mag 28(4):26–35
Sebastian A, Wiesmann D (2008) Modeling and experimental identification of silicon microheater dynamics: a systems approach. J Microelectromech Syst 17(4):911–920
Sebastian A, Pantazi A (2012) Nanopositioning with multiple sensors: a case study in data storage. IEEE Trans Control Syst Technol 20(2):382–394
Shan Y, Speich J, Leang K (2008) Low-cost IR reflective sensors for submicrolevel position measurement and control. Mechatronics IEEE/ASME Trans 13(6):700–709
Sirohi J, Chopra I (2000) Fundamental understanding of piezoelectric strain sensors. J Intell Mater Syst Struct 11:246–257
Sirohi RS (2009) Optical methods of measurement: wholefield techniques. CRC Press, Boca Raton
Smith CS (1954) Piezoresistance effect in germanium and silicon. Phys Rev 94(1):42–49
Sommargren GE (1986) A new laser measurement system for precision metrology. In: Proceedings of precision engineering conference, Dallas, Nov 1986
Tseng AA (ed) (2008) Nanofabrication: fundamentals and applications. World Scientific, Singapore
Tseng AA, Jou S, Notargiacomo A, Chen TP (2008) Recent developments in tip-based nanofabrication and its roadmap. J Nanosci Nanotechnol 8(5):2167–2186
Vicary JA, Miles MJ (2008) Pushing the boundaries of local oxidation nanolithography: short timescales and high speeds. Ultramicroscopy 108(10):1120–1123
Yong YK, Ahmed B, Moheimani SOR (2010) Atomic force microscopy with a 12-electrode piezoelectric tube scanner. Rev Sci Instrum 81(1–10):033701
Yong YK, Fleming AJ, Moheimani SOR (2013) A novel piezoelectric strain sensor for simultaneous damping and tracking control of a high-speed nanopositioner. IEEE/ASME Trans Mechatron 18(3):1113–1121
Zheng J, Salton A, Fu M (2011) Design and control of a rotary dual-stage actuator positioning system. Mechatronics 21(6):1003–1012
Zhu YK, Moheimani SOR, Yuce MR (2011) Simultaneous capacitive and electrothermal position sensing in a micromachined nanopositioner. Electron Device Lett 32(8):1146–1148
Zhu Y, Bazaei A, Moheimani SOR, Yuce M (2011) Design, modeling and control of a micromachined nanopositioner with integrated electrothermal actuation and sensing. IEEE/ASME J Microelectromech Syst 20(3):711–719
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2014 Springer International Publishing Switzerland
About this chapter
Cite this chapter
Fleming, A.J., Leang, K.K. (2014). Position Sensors. In: Design, Modeling and Control of Nanopositioning Systems. Advances in Industrial Control. Springer, Cham. https://doi.org/10.1007/978-3-319-06617-2_5
Download citation
DOI: https://doi.org/10.1007/978-3-319-06617-2_5
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-06616-5
Online ISBN: 978-3-319-06617-2
eBook Packages: EngineeringEngineering (R0)