Abstract
Determining the structure of amorphous materials used to be challenging due to the complexity of this material class. Despite many attempts to resolve amorphous materials by various diffraction methods as well as scanning probe methods, no-one has yet been able to carry out atomic imaging and to clearly identify the structure of amorphous materials. Only modern preparation methods in combination with advanced scanning tunneling and atomic force microscopy have succeeded in decrypting the everyday material glass. A bilayer silicate film on a ruthenium single crystal has been developed at the Fritz-Haber Institute. On the atomic level, this film is flat and ideal for using scanning probe microscopy. For the first time a clear image of an amorphous material has been obtained which allowed for the derivation of atomic sites and a detailed analysis from real space coordinates. The text book example of the vitreous silica structure proposed by William Zachariasen in 1932 has thereby finally been verified.
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Acknowledgments
The authors would like to thank Hans-Peter Rust and Gero Thielsch for major contributions to the development and maintenance of the experimental setup. Furthermore, we would like to acknowledge Kristen Burson, Thomas König, Georg Hermann Simon and Stefanie Stuckenholz for fruitful discussions.
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Büchner, C., Lichtenstein, L., Heyde, M., Freund, HJ. (2015). The Atomic Structure of Two-Dimensional Silica. In: Morita, S., Giessibl, F., Meyer, E., Wiesendanger, R. (eds) Noncontact Atomic Force Microscopy. NanoScience and Technology. Springer, Cham. https://doi.org/10.1007/978-3-319-15588-3_16
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